Publication detail

Microscale comparison of solar cell recombination centers

ŠKARVADA, P. TOMÁNEK, P. KOKTAVÝ, P.

Original Title

Microscale comparison of solar cell recombination centers

English Title

Microscale comparison of solar cell recombination centers

Type

journal article - other

Language

en

Original Abstract

The aim of this work is an experimental microscale comparison of several imperfection types of silicon solar cells which emit visible light under reverse bias condition. The setup with scanning probe microscope (SPM) and sensitive detector is used for the measurement of light emission in microscale. Used SPM allows a measurement of Light Beam Induced Current (LBIC) with high spatial resolution together with sample topography. Due to a number of observed defects that have no correlation with surface topography, we have found out that there are also defects having strong correlation with surface topography. In the most cases, investigated inhomogeneites could not be localized via light induced beam technique.

English abstract

The aim of this work is an experimental microscale comparison of several imperfection types of silicon solar cells which emit visible light under reverse bias condition. The setup with scanning probe microscope (SPM) and sensitive detector is used for the measurement of light emission in microscale. Used SPM allows a measurement of Light Beam Induced Current (LBIC) with high spatial resolution together with sample topography. Due to a number of observed defects that have no correlation with surface topography, we have found out that there are also defects having strong correlation with surface topography. In the most cases, investigated inhomogeneites could not be localized via light induced beam technique.

Keywords

solar cell, defects

RIV year

2011

Released

27.06.2011

Publisher

ZČU

Location

Plzeň

Pages from

25

Pages to

28

Pages count

4

BibTex


@article{BUT75327,
  author="Pavel {Škarvada} and Pavel {Tománek} and Pavel {Koktavý}",
  title="Microscale comparison of solar cell recombination centers",
  annote="The aim of this work is an experimental microscale comparison of several imperfection types of silicon solar cells which emit visible light under reverse bias condition. The setup with scanning probe microscope (SPM) and sensitive detector is used for the measurement of light emission in microscale. Used SPM allows a measurement of Light Beam Induced Current (LBIC) with high spatial resolution together with sample topography. Due to a number of observed defects that have no correlation with surface topography, we have found out that there are also defects having strong correlation with surface topography. In the most cases, investigated inhomogeneites could not be localized via light induced beam technique.",
  address="ZČU",
  chapter="75327",
  institution="ZČU",
  number="4",
  volume="2011",
  year="2011",
  month="june",
  pages="25--28",
  publisher="ZČU",
  type="journal article - other"
}