Publication detail

Carrier Bulk-Lifetime Measurement during Solar Cell Production

SOLČANSKÝ, M. VANĚK, J.

Original Title

Carrier Bulk-Lifetime Measurement during Solar Cell Production

Type

journal article - other

Language

English

Original Abstract

The main material parameter of silicon is the minority carrier bulk lifetime and influences the effectiveness of photovoltaic cells. It may change in the technological process especially during high temperature operations. Monitoring of the carrier bulk-lifetime is necessary for modifying the whole technological process of production. This work deals with an examination of a different solution types for the chemical passivation of a silicon surface. Various solutions are tested on silicon wafers for their consequent comparison. The main purpose of this work is to find optimal solution, which suits the requirements of a time stability and start-up velocity of passivation, reproducibility of the measurements and a possibility of a perfect cleaning of a passivating solution remains from a silicon surface, so that the parameters of a measured silicon wafer will not worsen and there will not be any contamination of the other wafers series in the production after a repetitive return of the measured wafer into the production process. The cleaning process itself is also a subject of a development.

Keywords

chemical passivation, quinhydrone, bulk-lifetime

Authors

SOLČANSKÝ, M.; VANĚK, J.

RIV year

2011

Released

1. 11. 2011

ISBN

1802-4564

Periodical

ElectroScope - http://www.electroscope.zcu.cz

Year of study

2011

Number

4

State

Czech Republic

Pages from

1

Pages to

4

Pages count

4

BibTex

@article{BUT74134,
  author="Marek {Solčanský} and Jiří {Vaněk}",
  title="Carrier Bulk-Lifetime Measurement during Solar Cell Production",
  journal="ElectroScope - http://www.electroscope.zcu.cz",
  year="2011",
  volume="2011",
  number="4",
  pages="1--4",
  issn="1802-4564"
}