Publication detail

Implementation of diagnostics functions in the IGBT drivers, part 1. Diagnostics

KNOBLOCH, J. KLÍMA, B. NOUMAN, Z. POCHYLA, M.

Original Title

Implementation of diagnostics functions in the IGBT drivers, part 1. Diagnostics

Type

conference paper

Language

English

Original Abstract

The paper deals with possibilities of power IGBT transistor diagnostics directly in driver of voltage source inverters. It is necessary to implement the diagnostics circuits as close as possible to the power IGBT transistor due to high demands on drive reliability and failure predictability in many applications. Possibilities of diagnostics quantities measurements are discussed in the paper. The measurements of transistor chip temperature, voltage overshoot size, off-state voltage, on-state saturation voltage, measurement of inverter output current, gate charge measurement and driver secondary side supply voltages are discussed. Possibilities of IGBT diagnosis and IGBT technical state based on measured data are also discussed. The paper also proposes some hardware solutions for obtaining mentioned information and methods of using measured data in IGBT downgrading progress monitoring, failure prediction and drive maintenance planning.

Keywords

diagnostics; IGBT driver; power transistor

Authors

KNOBLOCH, J.; KLÍMA, B.; NOUMAN, Z.; POCHYLA, M.

RIV year

2011

Released

6. 9. 2011

Location

Bologna, IT

ISBN

978-1-4244-9302-9

Book

Proceedings of the 8th IEEE Symposium on Diagnostics for Electrical Machines, Power Electronics & Drives

Pages from

1

Pages to

4

Pages count

4

BibTex

@inproceedings{BUT73214,
  author="Jan {Knobloch} and Bohumil {Klíma} and Ziad {Nouman} and Martin {Pochyla}",
  title="Implementation of diagnostics functions in the IGBT drivers, part 1. Diagnostics",
  booktitle="Proceedings of the 8th IEEE Symposium on Diagnostics for Electrical Machines, Power Electronics & Drives",
  year="2011",
  pages="1--4",
  address="Bologna, IT",
  isbn="978-1-4244-9302-9"
}