Publication detail

Alternating current thin film electroluminescent device characterization

AHMED, M.

Original Title

Alternating current thin film electroluminescent device characterization

English Title

Alternating current thin film electroluminescent device characterization

Type

dissertation

Language

en

Original Abstract

The objective of this thesis is to study the optical and electrical characterization of Alternating-Current Thin-Film ElectroLuminescent (ACTFEL) devices, and specifically the aging process of phosphor materials that comprise the ACTFEL display in an effort to improve the overall performance of the primary phosphor colors in terms of brightness, efficiency and stability. The study of the aging characteristics of evaporated and atomic layer epitaxy ZnS:Mn phosphors has been undertaken by monitoring the luminance-voltage (L-V) internal charge-phosphor field (Q-Fp) and capacitance-voltage (C-V) electrical characteristics at in selected time intervals during aging. Short-term and long-term ACTFEL aging studies has been provided and an attempt to visualize locally the structure of phosphor with a subwavelenght resolution using Scanning near-field optical microscope (SNOM) has also been presented. The practical case of a green Zn2GeO4:Mn (2% Mn) ACTFEL device operated at 50 Hz has been studied and a luminance stability by a measurement of luminance-voltage (L-V) and luminous efficiency-voltage ( -V) characteristics evaluated.

English abstract

The objective of this thesis is to study the optical and electrical characterization of Alternating-Current Thin-Film ElectroLuminescent (ACTFEL) devices, and specifically the aging process of phosphor materials that comprise the ACTFEL display in an effort to improve the overall performance of the primary phosphor colors in terms of brightness, efficiency and stability. The study of the aging characteristics of evaporated and atomic layer epitaxy ZnS:Mn phosphors has been undertaken by monitoring the luminance-voltage (L-V) internal charge-phosphor field (Q-Fp) and capacitance-voltage (C-V) electrical characteristics at in selected time intervals during aging. Short-term and long-term ACTFEL aging studies has been provided and an attempt to visualize locally the structure of phosphor with a subwavelenght resolution using Scanning near-field optical microscope (SNOM) has also been presented. The practical case of a green Zn2GeO4:Mn (2% Mn) ACTFEL device operated at 50 Hz has been studied and a luminance stability by a measurement of luminance-voltage (L-V) and luminous efficiency-voltage ( -V) characteristics evaluated.

Keywords

alternating-current thin-film electroluminescence (ACTFEL), electroluminescent displays, phospors, ZnSMn2, green Zn2GeO4Mn, ZnSMn doped with KCl, topography, electrical characteristics, transport characteristics, optical characteristics, brightness and threshold voltage, photo-induced charge, photo-induced luminance, temperature and thickness effects, aging process, aging analysis, aging trends, Scanning Near-field Optical Microscopy, measurement

RIV year

2008

Released

07.05.2008

Publisher

Vutium

Location

Brno

Pages from

1

Pages to

27

Pages count

27

BibTex


@phdthesis{BUT67059,
  author="Mustafa M. Abdalla {Ahmed}",
  title="Alternating current thin film electroluminescent device characterization",
  annote="The objective of this thesis is to study the optical and electrical characterization of Alternating-Current Thin-Film ElectroLuminescent (ACTFEL) devices, and specifically the aging process of phosphor materials that comprise the ACTFEL display in an effort to improve the overall performance of the primary phosphor colors in terms of brightness, efficiency and stability.
The study of the aging characteristics of evaporated and atomic layer epitaxy ZnS:Mn phosphors has been undertaken by monitoring the luminance-voltage  (L-V) internal charge-phosphor field (Q-Fp) and capacitance-voltage (C-V) electrical characteristics at in selected time intervals during aging. Short-term and long-term ACTFEL aging studies has been provided and an attempt to visualize locally the structure of phosphor with a subwavelenght resolution using Scanning near-field optical microscope (SNOM) has also been presented. 
The practical case of a green Zn2GeO4:Mn (2% Mn) ACTFEL device operated at 50 Hz has been studied and a luminance stability by a measurement of luminance-voltage (L-V) and luminous efficiency-voltage ( -V) characteristics evaluated. 
",
  address="Vutium",
  chapter="67059",
  institution="Vutium",
  year="2008",
  month="may",
  pages="1--27",
  publisher="Vutium",
  type="dissertation"
}