Publication detail

Gamma Ray Damage of Unbiased CCD Image Sensors

Z. Barton, R. Vrba

Original Title

Gamma Ray Damage of Unbiased CCD Image Sensors

Type

conference proceedings

Language

English

Original Abstract

High image quality Charge-coupled device (CCD) image sensors are needed in many applications. Low noise and high dynamic range are critical parameters required in scientific and industrial applications. In many of the applications, however, the CCD image sensor can be irradiated by a ionizing radiation, as alpha, beta, gamma or x-ray. This paper shows behaviour of low noise, high dynamic range, 1 Megapixel Frame-Transfer CCD FTT1010-M [1] image sensor radiated by gamma ray radiation. CCD image sensor driver board with rad-hard components was designed and used during the tests. Results of the investigation will be used in system for protein crystallization study in microgravity.

Keywords

Gamma Ray, Damage, CCD Image Sensor, Unbiased

Authors

Z. Barton, R. Vrba

Released

1. 1. 2005

Publisher

ET2005

ISBN

954-438-518-5

Book

14th International Scientific and Applied Science Conference

Pages from

194

Pages to

198

Pages count

5

BibTex

@proceedings{BUT64585,
  editor="Zdeněk {Bartoň} and Radimír {Vrba}",
  title="Gamma Ray Damage of Unbiased CCD Image Sensors",
  year="2005",
  pages="5",
  publisher="ET2005",
  isbn="954-438-518-5"
}