Publication detail

Physical Propertie of Plasmatic and Evaporated Polysilylenes

SALYK, O., HORVÁTH, P., WEITER, M., SCHAUER, F.

Original Title

Physical Propertie of Plasmatic and Evaporated Polysilylenes

English Title

Physical Propertie of Plasmatic and Evaporated Polysilylenes

Type

conference proceedings

Language

en

Original Abstract

Poly(dimethylsilylene) thin films were deposited by vacuum evaporation method. Films were measured by infrared absorption spectroscopy, ultraviolet absorption spectroscopy, luminescence and electroluminescence, and results were compared. Vacuum deposited films have character of oligomers, mechanically soft and undergo distortion if electrically contacted. They are well oriented in the perpendicular direction to the substrate and exhibit good luminescence of óó* exciton on wavelength 330−345 nm. Material tends to recrystallize. Films prepared under electron beam treatment and electron cross beam ionization are cross linked, disordered, firm and mechanically stable. Luminescence intensity is much lower but prepared light emitting diodes are relatively stable.

English abstract

Poly(dimethylsilylene) thin films were deposited by vacuum evaporation method. Films were measured by infrared absorption spectroscopy, ultraviolet absorption spectroscopy, luminescence and electroluminescence, and results were compared. Vacuum deposited films have character of oligomers, mechanically soft and undergo distortion if electrically contacted. They are well oriented in the perpendicular direction to the substrate and exhibit good luminescence of óó* exciton on wavelength 330−345 nm. Material tends to recrystallize. Films prepared under electron beam treatment and electron cross beam ionization are cross linked, disordered, firm and mechanically stable. Luminescence intensity is much lower but prepared light emitting diodes are relatively stable.

Keywords

polysilane, electroluminescence

RIV year

1998

Released

01.01.1998

Publisher

Ústav fyziky SAV

Location

Bratislava

Pages from

24

Pages to

24

Pages count

1

BibTex


@proceedings{BUT64261,
  author="Ota {Salyk} and Pavel {Horváth} and Martin {Weiter} and František {Schauer}",
  title="Physical Propertie of Plasmatic and Evaporated Polysilylenes",
  annote="Poly(dimethylsilylene) thin films were deposited by vacuum evaporation method.  Films were measured by infrared absorption spectroscopy, ultraviolet absorption spectroscopy, luminescence and electroluminescence,  and results were compared. Vacuum deposited films have character of oligomers, mechanically soft and undergo distortion if electrically contacted. They are well oriented in the perpendicular direction to the substrate and exhibit good luminescence of óó* exciton on wavelength 330−345 nm. Material tends to recrystallize. Films prepared under electron beam treatment and electron cross beam ionization are cross linked, disordered,  firm and mechanically stable. Luminescence intensity is much lower but prepared light emitting diodes are relatively stable.",
  address="Ústav fyziky SAV",
  booktitle="Interantional Workshop on Diagnostic of Solid State Surfaces",
  chapter="64261",
  edition="1998",
  institution="Ústav fyziky SAV",
  year="1998",
  month="january",
  pages="24",
  publisher="Ústav fyziky SAV",
  type="conference proceedings"
}