Publication detail

Konduktometrické snímače

HUBÁLEK, J.

Original Title

Konduktometrické snímače

Type

presentation

Language

English

Original Abstract

Presented results show possibilities of precise measurement with planar sensors, fabricated by thick-film technology to relaize comb-like planar structure. Impedance behavior of these sensors is different in comparision with theory. Some dependencies can be shown. High influence has parallel capacitance of the planar electrodes. Development of precise method for measurement is focused on modified method of bipolar pulse technique and its realisation as CMOS chip.

Keywords

tlustovrstvá čidla, impedance elektrod, planární struktura, hřenínková struktura, vodivostní měření, mikrosensor, metoda bipolárního impulsu

Key words in English

thick-film sensors, electrode interface impedance , planar structure, comb-like structure, conductivity measurement, microsensor, bipolar pulse method

Authors

HUBÁLEK, J.

RIV year

2003

Released

31. 12. 2002

URL

UMEL

BibTex

@misc{BUT63594,
  author="Jaromír {Hubálek}",
  title="Konduktometrické snímače",
  year="2002",
  url="UMEL",
  note="presentation"
}