Publication detail

Advanced tunable protective structure against electrostatic discharge

Petr Běťák

Original Title

Advanced tunable protective structure against electrostatic discharge

Type

abstract

Language

English

Original Abstract

New advanced SCR structures provide ESD characteristics adjustibility to be optimal for certain application. Optimal adjustment of silicon active areas dimensions is necessary to simulate by computer aided design systems (TCAD). Then can be uniquely determined which features will be given by certain dimensions setting. For applications with different requirements might be various geometrical masks of one structure produced and by this way to meet with defined requirements only using different type of mask.

Keywords

ESD, SCR, electrostatic discharge, silicon controlled rectifier

Authors

Petr Běťák

Released

1. 1. 2007

ISBN

978-973-713-174-4

Book

ISSE 2007 30th International Spring Seminar on Electronics Technology 2007

Pages from

238

Pages to

239

Pages count

2

BibTex

@misc{BUT60524,
  author="Petr {Běťák}",
  title="Advanced tunable protective structure against electrostatic discharge",
  booktitle="ISSE 2007 30th International Spring Seminar on Electronics Technology 2007",
  year="2007",
  pages="2",
  isbn="978-973-713-174-4",
  note="abstract"
}