Publication detail

Two Level Testability System

KOTÁSEK, Z., STRNADEL, J., RŮŽIČKA, R., ZBOŘIL, F.

Original Title

Two Level Testability System

English Title

Two Level Testability System

Type

conference paper

Language

en

Original Abstract

Principles of two level testability analysis system will are described in the paper. The behavioural description of the unit under analysis (UUA) is the first level, on which the source VHDL file is taken as an input. On this level, the VHDL constructions which might cause testability problems in the resulting design are identified and the possibility of deriving i paths is evaluated. The RT level is the second level, on which the testability aspects are taken into account. For these purposes, the RT level structure is converted into a directed labelled graph which reflects the structure of the UUA and its diagnostic features which are important for the testability analysis. The analysis is done on the graph instead of on the VHDL source text.

English abstract

Principles of two level testability analysis system will are described in the paper. The behavioural description of the unit under analysis (UUA) is the first level, on which the source VHDL file is taken as an input. On this level, the VHDL constructions which might cause testability problems in the resulting design are identified and the possibility of deriving i paths is evaluated. The RT level is the second level, on which the testability aspects are taken into account. For these purposes, the RT level structure is converted into a directed labelled graph which reflects the structure of the UUA and its diagnostic features which are important for the testability analysis. The analysis is done on the graph instead of on the VHDL source text.

Keywords

RTL, Testability Analysis, VHDL

RIV year

2001

Released

01.01.2001

Location

Ostrava

ISBN

80-85988-57-7

Book

Proceedings of the 35th Spring International Conference MOSIS'01

Pages from

433

Pages to

440

Pages count

8

Documents

BibTex


@inproceedings{BUT5604,
  author="Zdeněk {Kotásek} and Richard {Růžička} and Josef {Strnadel} and František {Zbořil}",
  title="Two Level Testability System",
  annote="Principles of two level testability analysis system will are described in the paper. The behavioural description of the unit under analysis (UUA) is the first level, on which the source VHDL file is taken as an input. On this level, the VHDL constructions which might cause testability problems in the resulting design are identified and the possibility of deriving i paths is evaluated. The RT level is the second level, on which the testability aspects are taken into account. For these purposes, the RT level structure is converted into a directed labelled graph which reflects the structure of the UUA and its diagnostic features which are important for the  testability analysis. The analysis is done on the graph instead of on the VHDL source text.",
  booktitle="Proceedings of the 35th Spring International Conference MOSIS'01",
  chapter="5604",
  year="2001",
  month="january",
  pages="433--440",
  type="conference paper"
}