Publication detail

TCAD Tools in Device Characterization and Parameter Extraction

RECMAN, M.

Original Title

TCAD Tools in Device Characterization and Parameter Extraction

Type

conference paper

Language

English

Original Abstract

Simulation based (process-device) extraction methodology brings advantages both in cost savings and in reducing time-to-market. Instead of enduring the high cost and long time required for silicon fabrication, device designers obtain almost immediately the SPICE model parameters that result from "what if" process change analysis. This provokes a constantly growing need for complete device characterization and parameter extraction on the basis of simulated data provided by process and device simulators. Parameter extractors are those tools that link process-device simulation to circuit simulation and the main goal is to extract device model parameter values from front-end technological parameters. At present the exploitation of the integrated TCAD tools to solve this problem is under study. The approaches to integrate process, device and circuit simulation TCAD tools are reviewed and examples of parameter extractors of leading TCAD vendors are presented.

Key words in English

TCAD, device characterization, parameter extraction,

Authors

RECMAN, M.

RIV year

2002

Released

1. 1. 2002

Publisher

Ing. Z. Novotný, Brno 2002

Location

Brno

ISBN

80-214-2217-3

Book

Socrates Workshop 2002 - Proceedings. Intensive Training Programme in Electronic System Design

Pages from

132

Pages to

137

Pages count

6

BibTex

@inproceedings{BUT5525,
  author="Milan {Recman}",
  title="TCAD Tools in Device Characterization and Parameter Extraction",
  booktitle="Socrates Workshop 2002 - Proceedings. Intensive Training Programme in Electronic System Design",
  year="2002",
  pages="6",
  publisher="Ing. Z. Novotný, Brno 2002",
  address="Brno",
  isbn="80-214-2217-3"
}