Publication detail

Local light to electric energy conversion measurement of silicon solar cells

ŠKARVADA, P. TOMÁNEK, P.

Original Title

Local light to electric energy conversion measurement of silicon solar cells

English Title

Local light to electric energy conversion measurement of silicon solar cells

Type

conference paper

Language

en

Original Abstract

The paper is focused on non-destructive detection of structural errors, and on local illumination to electric energy conversion measurement in the solar cell using a near-field optical scanning microscope (SNOM). The principal objective of this study is to find out a relationship between surface or structure errors and defects observed in electric characteristics of solar cell samples. The defects and local mechanical damage of Si solar cell can result in lower light to electric energy conversion efficiency. The influence of surface scratching on reverse I-V characteristics of single-crystal silicon solar cell is also presented. The topography measurement, local surface reflection and local light to electric energy conversion measurement in areas damaged by a scratch are also provided.

English abstract

The paper is focused on non-destructive detection of structural errors, and on local illumination to electric energy conversion measurement in the solar cell using a near-field optical scanning microscope (SNOM). The principal objective of this study is to find out a relationship between surface or structure errors and defects observed in electric characteristics of solar cell samples. The defects and local mechanical damage of Si solar cell can result in lower light to electric energy conversion efficiency. The influence of surface scratching on reverse I-V characteristics of single-crystal silicon solar cell is also presented. The topography measurement, local surface reflection and local light to electric energy conversion measurement in areas damaged by a scratch are also provided.

Keywords

Scanning near-field optical microscope, local light to electric energy conversion measurement, reflection, solar cell

RIV year

2008

Released

07.05.2008

Publisher

Zsolt Illyefalvi-Vitéz, Bálint Balogh

Location

Hungary, Budapest

ISBN

978-963-06-4915-5

Book

Reliability and Life-time Prediction, Conference Proceedings

Edition number

1

Pages from

101

Pages to

104

Pages count

4

BibTex


@inproceedings{BUT5034,
  author="Pavel {Škarvada} and Pavel {Tománek}",
  title="Local light to electric energy conversion measurement of silicon solar cells",
  annote="The paper is focused on non-destructive detection of structural errors, and on local illumination to electric energy conversion measurement in the solar cell using a near-field optical scanning microscope (SNOM). The principal objective of this study is to find out a relationship between surface or structure errors and defects observed in electric characteristics of solar cell samples. The defects and local mechanical damage of Si solar cell can result in lower light to electric energy conversion efficiency. The influence of surface scratching on reverse I-V characteristics of single-crystal silicon solar cell is also presented. The topography measurement, local surface reflection and local light to electric energy conversion measurement in areas damaged by a scratch are also provided.",
  address="Zsolt Illyefalvi-Vitéz, Bálint Balogh",
  booktitle="Reliability and Life-time Prediction, Conference Proceedings",
  chapter="5034",
  howpublished="print",
  institution="Zsolt Illyefalvi-Vitéz, Bálint Balogh",
  year="2008",
  month="may",
  pages="101--104",
  publisher="Zsolt Illyefalvi-Vitéz, Bálint Balogh",
  type="conference paper"
}