Publication detail

Noise in Piezoelectric Ceramics at the low temperatures

SEDLÁK, P. MAJZNER, J. ŠIKULA, J.

Original Title

Noise in Piezoelectric Ceramics at the low temperatures

English Title

Noise in Piezoelectric Ceramics at the low temperatures

Type

journal article

Language

en

Original Abstract

The observed spectra of fluctuating voltage or current can be very well described by the generalized Nyquist relation for linear dissipative system. In this work, we focused on validity of the Nyquist relation for piezoelectric ceramics in temperatures 150 K-270 K. The electrical impedance and noise spectral density are measured and compared in frequency range 100 kHz 1 MHz.

English abstract

The observed spectra of fluctuating voltage or current can be very well described by the generalized Nyquist relation for linear dissipative system. In this work, we focused on validity of the Nyquist relation for piezoelectric ceramics in temperatures 150 K-270 K. The electrical impedance and noise spectral density are measured and compared in frequency range 100 kHz 1 MHz.

Keywords

piezoelectric ceramics, thermal noise, 1/f noise

RIV year

2011

Released

12.04.2011

Publisher

SPOLECNOST PRO RADIOELEKTRONICKE INZENYRSTVI

Location

Prague

Pages from

200

Pages to

2003

Pages count

4

BibTex


@article{BUT50043,
  author="Petr {Sedlák} and Jiří {Majzner} and Josef {Šikula}",
  title="Noise in Piezoelectric Ceramics at the low temperatures",
  annote="The observed spectra of fluctuating voltage or current can be very well described by the generalized Nyquist relation for linear dissipative system. In this work, we focused on validity of the Nyquist relation for piezoelectric ceramics in temperatures 150 K-270 K. The electrical impedance and noise spectral density are measured and compared in frequency range 100 kHz   1 MHz.",
  address="SPOLECNOST PRO RADIOELEKTRONICKE INZENYRSTVI",
  chapter="50043",
  institution="SPOLECNOST PRO RADIOELEKTRONICKE INZENYRSTVI",
  journal="Radioengineering",
  number="1",
  volume="20",
  year="2011",
  month="april",
  pages="200--2003",
  publisher="SPOLECNOST PRO RADIOELEKTRONICKE INZENYRSTVI",
  type="journal article"
}