Publication detail

Process Characterization and Description in Order to Reliability Assessment

NOVOTNÝ, R.

Original Title

Process Characterization and Description in Order to Reliability Assessment

English Title

Process Characterization and Description in Order to Reliability Assessment

Type

journal article - other

Language

en

Original Abstract

This article presents some important aspect relating to the process characterization and description using empirical approach in order to electronic device reliability assessment. The traditional probabilistic approach is to a large degree replaced by empirical study approaches constructed on designed reliability testing experiments. This contribution presents the response surface methodology as a statistical tool for creating maps of performance stability for supposed device operating conditions.

English abstract

This article presents some important aspect relating to the process characterization and description using empirical approach in order to electronic device reliability assessment. The traditional probabilistic approach is to a large degree replaced by empirical study approaches constructed on designed reliability testing experiments. This contribution presents the response surface methodology as a statistical tool for creating maps of performance stability for supposed device operating conditions.

Keywords

analysis, variation, quantification, experiment, optimization, factor, response, design

RIV year

2008

Released

01.01.2008

Publisher

Naun.org

Pages from

303

Pages to

309

Pages count

7

BibTex


@article{BUT49207,
  author="Radovan {Novotný}",
  title="Process Characterization and Description in Order to Reliability Assessment",
  annote="This article presents some important aspect relating to the process characterization and description using empirical approach in order to electronic device reliability assessment. The traditional probabilistic approach is to a large degree replaced by empirical study approaches constructed on designed reliability testing experiments. This contribution presents the response surface methodology as a statistical tool for creating maps of performance stability for supposed device operating conditions.",
  address="Naun.org",
  chapter="49207",
  institution="Naun.org",
  journal="International Journal of Circuits Systems and Signal Processing",
  number="4",
  volume="2007",
  year="2008",
  month="january",
  pages="303--309",
  publisher="Naun.org",
  type="journal article - other"
}