Publication detail

Nyquist relation and its validity for piezoelectric ceramics considering temperature

SEDLÁK, P. MAJZNER, J. ŠIKULA, J.

Original Title

Nyquist relation and its validity for piezoelectric ceramics considering temperature

English Title

Nyquist relation and its validity for piezoelectric ceramics considering temperature

Type

journal article - other

Language

en

Original Abstract

In this paper, we focused on validity of the Nyquist relation for piezoelectric ceramics in temperatures 303 K - 393 K. The electrical impedance and noise spectral density were measured and compared for every 10 K in frequency range 100 kHz - 1 MHz. The measurements were made in thermal stable condition and under equilibrium conditions in the case of noise measurement

English abstract

In this paper, we focused on validity of the Nyquist relation for piezoelectric ceramics in temperatures 303 K - 393 K. The electrical impedance and noise spectral density were measured and compared for every 10 K in frequency range 100 kHz - 1 MHz. The measurements were made in thermal stable condition and under equilibrium conditions in the case of noise measurement

Keywords

piezoelectric ceramics, noise spectral density, Nyquist relation

RIV year

2009

Released

14.06.2009

Publisher

American Institute of Physics

Location

Melville, New York

ISBN

0094-243X

Periodical

AIP conference proceedings

Year of study

1129

Number

1

State

US

Pages from

141

Pages to

144

Pages count

4

Documents

BibTex 


@article{BUT48458,
  author="Petr {Sedlák} and Jiří {Majzner} and Josef {Šikula}",
  title="Nyquist relation and its validity for piezoelectric ceramics considering temperature",
  annote="In this paper, we focused on validity of the Nyquist relation for piezoelectric ceramics in temperatures 303 K - 393 K. The electrical impedance and noise spectral density were measured and compared for every 10 K in frequency range 100 kHz - 1 MHz. The measurements were made in thermal stable condition and under equilibrium conditions in the case of noise measurement",
  address="American Institute of Physics",
  chapter="48458",
  institution="American Institute of Physics",
  journal="AIP conference proceedings",
  number="1",
  volume="1129",
  year="2009",
  month="june",
  pages="141--144",
  publisher="American Institute of Physics",
  type="journal article - other"
}