Publication detail

Influence of charged centers on transport characteristics of alternating current thin film electroluminescent devices

AHMED, M. TOMÁNEK, P.

Original Title

Influence of charged centers on transport characteristics of alternating current thin film electroluminescent devices

English Title

Influence of charged centers on transport characteristics of alternating current thin film electroluminescent devices

Type

journal article in Web of Science

Language

en

Original Abstract

Charged centers exist in the phosphor layer of common alternating current thin film electroluminescent devices. In this article, the electron scattering process by these centers is studied through phase shift analysis. The scattering rates in different cases are gained and compared with other important scattering processes. The electron transport process is simulated by means of the Monte Carlo method. Quantitative results about the influence of charged centers on electron kinetic energy are gained.

English abstract

Charged centers exist in the phosphor layer of common alternating current thin film electroluminescent devices. In this article, the electron scattering process by these centers is studied through phase shift analysis. The scattering rates in different cases are gained and compared with other important scattering processes. The electron transport process is simulated by means of the Monte Carlo method. Quantitative results about the influence of charged centers on electron kinetic energy are gained.

Keywords

electroluminescence, thin film, alternating current, charge center, transport characteristics

RIV year

2006

Released

01.02.2006

Publisher

SPIE

Location

Bellimgham, USA

Pages from

61

Pages to

65

Pages count

5

BibTex


@article{BUT45822,
  author="Mustafa M. Abdalla {Ahmed} and Pavel {Tománek}",
  title="Influence of charged centers on transport characteristics of alternating current thin film electroluminescent devices",
  annote="Charged centers exist in the phosphor layer of common alternating current thin film electroluminescent devices. In this article, the electron scattering process by these centers is studied through phase shift analysis. The scattering rates in different cases are gained and compared with other important scattering processes. The electron transport process is simulated by means of the Monte Carlo method. Quantitative results about the influence of charged centers on electron kinetic energy are gained.",
  address="SPIE",
  chapter="45822",
  institution="SPIE",
  journal="Proceedings of SPIE",
  number="6018",
  volume="6018",
  year="2006",
  month="february",
  pages="61--65",
  publisher="SPIE",
  type="journal article in Web of Science"
}