Publication detail

Near-field measurement of ZnS:Mn nanocrystal and bulk thin-film electroluminescent devices

GRMELA, L. MACKŮ, R. TOMÁNEK, P.

Original Title

Near-field measurement of ZnS:Mn nanocrystal and bulk thin-film electroluminescent devices

Type

journal article in Web of Science

Language

English

Original Abstract

A study of the electro-optical and aging characteristics of nanostructured and bulk ZnS:Mn ACTFEL devices is presented. ZnS:Mn nanocrystals contain four different concentrations of Mn (from 0.05 to 1.0 wt%). Almost all previous measurements have been done in the far-field, therefore a local study of optical near-field of samples was applied. Although the electro-optic performance and aging behavior of these devices is rather good, the luminous efficiency is currently not sufficient to justify commercialization of this phosphor. SNOM technique has shown to be extremely important characterization tools for nanostructured materials, not only for engineered semiconductor materials but for molecular-based nanostructures as well.

Keywords

Electroluminescence, luminescence centers, nanocrystal, phosphors, photoluminescence, scanning near-field optical microscopy, ZnS:Mn

Authors

GRMELA, L.; MACKŮ, R.; TOMÁNEK, P.

RIV year

2008

Released

1. 2. 2008

Publisher

Blackwell Publishing

Location

London

ISBN

0022-2720

Periodical

Journal of Microscopy

Year of study

229

Number

2

State

United Kingdom of Great Britain and Northern Ireland

Pages from

275

Pages to

280

Pages count

6

BibTex

@article{BUT44530,
  author="Lubomír {Grmela} and Robert {Macků} and Pavel {Tománek}",
  title="Near-field measurement of ZnS:Mn nanocrystal and bulk thin-film electroluminescent devices",
  journal="Journal of Microscopy",
  year="2008",
  volume="229",
  number="2",
  pages="275--280",
  issn="0022-2720"
}