Publication detail

Failure modes of tantalum capacitors made by different technologies

VAŠINA, P. ZEDNÍČEK, T. ŠIKULA, J. PAVELKA, J.

Original Title

Failure modes of tantalum capacitors made by different technologies

Type

journal article - other

Language

English

Original Abstract

Failure modes of tantalum capacitors made by different technologies are investigated.

Keywords

noise, reliability

Authors

VAŠINA, P.; ZEDNÍČEK, T.; ŠIKULA, J.; PAVELKA, J.

Released

1. 1. 2002

ISBN

0026-2714

Periodical

Microelectronics Reliability

Year of study

42

Number

6

State

United Kingdom of Great Britain and Northern Ireland

Pages from

849

Pages to

854

Pages count

6

BibTex

@article{BUT43781,
  author="Petr {Vašina} and Tomáš {Zedníček} and Josef {Šikula} and Jan {Pavelka}",
  title="Failure modes of tantalum capacitors made by different technologies",
  journal="Microelectronics Reliability",
  year="2002",
  volume="42",
  number="6",
  pages="6",
  issn="0026-2714"
}