Publication detail
Non destructive testing - identification of defects in materials
BACHOREC, T. DĚDKOVÁ, J.
Original Title
Non destructive testing - identification of defects in materials
English Title
Non destructive testing - identification of defects in materials
Type
journal article - other
Language
en
Original Abstract
In electrical impedance tomography (EIT) currents are applied through the electrodes attached on the surface of the object, and the resulting voltages are measured using the same or additional electrodes. Internal conductivity distribution is recalculated from the measured voltages and currents. The problem is very ill posed, and therefore, regularization has to be used. The aim is to reconstruct, as accurately as possible, the conductivity distribution in phantom using finite element method (FEM). In this paper are proposed variations of the regularization term, which are applied to non-destructive identification of defects (voids or cracks) in conductive material.
English abstract
In electrical impedance tomography (EIT) currents are applied through the electrodes attached on the surface of the object, and the resulting voltages are measured using the same or additional electrodes. Internal conductivity distribution is recalculated from the measured voltages and currents. The problem is very ill posed, and therefore, regularization has to be used. The aim is to reconstruct, as accurately as possible, the conductivity distribution in phantom using finite element method (FEM). In this paper are proposed variations of the regularization term, which are applied to non-destructive identification of defects (voids or cracks) in conductive material.
Keywords
Impedance tomography, inverse problem, non-destructive testing
RIV year
2006
Released
01.05.2006
ISBN
1336-1376
Periodical
Advances in Electrical and Electronic Engineering
Year of study
1.
Number
No. 1-2
State
SK
Pages from
1
Pages to
4
Pages count
4
Documents
BibTex
@article{BUT43199,
author="Tibor {Bachorec} and Jarmila {Dědková}",
title="Non destructive testing - identification of defects in materials",
annote="In electrical impedance tomography (EIT) currents are applied through the electrodes attached on the surface of the object, and the resulting voltages are measured using the same or additional electrodes. Internal conductivity distribution is recalculated from the measured voltages and currents. The problem is very ill posed, and therefore, regularization has to be used. The aim is to reconstruct, as accurately as possible, the conductivity distribution in phantom using finite element method (FEM). In this paper are proposed variations of the regularization term, which are applied to non-destructive identification of defects (voids or cracks) in conductive material.",
chapter="43199",
journal="Advances in Electrical and Electronic Engineering",
number="No. 1-2",
volume="1.",
year="2006",
month="may",
pages="1",
type="journal article - other"
}