Publication detail

Characterization of Si Solar Cells Imperfections in the Near-Field

ŠKARVADA, P. TOMANEK, P. MACKŮ, R.

Original Title

Characterization of Si Solar Cells Imperfections in the Near-Field

English Title

Characterization of Si Solar Cells Imperfections in the Near-Field

Type

conference paper

Language

en

Original Abstract

This paper deals with microscale localization of solar cell imperfections. Imperfections are areas on the solar cell that emits light in visible range when the cell is reverse-biased. Samples under investigation are monocrystalline silicon solar cells. Local topography, near-field optical beam induced current, local optical properties and local visible light emission using high resolution and high sensitive techniques together with light emission thermal dependence have been measured. Generally light emission occurs in places where the near-field optical beam induced current has its local minima. The results when there is no evident correlation between light emission and near-field optical beam induced current are presented in this paper. It was found that one light emission macroscopic spot can consist of several small light emission spots which diameters are less than 8 ?m.

English abstract

This paper deals with microscale localization of solar cell imperfections. Imperfections are areas on the solar cell that emits light in visible range when the cell is reverse-biased. Samples under investigation are monocrystalline silicon solar cells. Local topography, near-field optical beam induced current, local optical properties and local visible light emission using high resolution and high sensitive techniques together with light emission thermal dependence have been measured. Generally light emission occurs in places where the near-field optical beam induced current has its local minima. The results when there is no evident correlation between light emission and near-field optical beam induced current are presented in this paper. It was found that one light emission macroscopic spot can consist of several small light emission spots which diameters are less than 8 ?m.

Keywords

silicon solar cell, defects, reverse-bias electroluminescence

RIV year

2010

Released

10.09.2010

Publisher

WIP - Renewable Energies

Location

Valencia

ISBN

3-936338-26-4

Book

25th European Photovoltaic Solar Energy Conference (id 18618)

Pages from

351

Pages to

354

Pages count

4

BibTex


@inproceedings{BUT35590,
  author="Pavel {Škarvada} and Pavel {Tomanek} and Robert {Macků}",
  title="Characterization of Si Solar Cells Imperfections in the Near-Field",
  annote="This paper deals with microscale localization of solar cell imperfections. Imperfections are areas on the solar cell that emits light in visible range when the cell is reverse-biased. Samples under investigation are monocrystalline silicon solar cells. Local topography, near-field optical beam induced current, local optical properties and local visible light emission using high resolution and high sensitive techniques together with light emission thermal dependence have been measured. Generally light emission occurs in places where the near-field optical beam induced current has its local minima. The results when there is no evident correlation between light emission and near-field optical beam induced current are presented in this paper. It was found that one light emission macroscopic spot can consist of several small light emission spots which diameters are less than 8 ?m.",
  address="WIP - Renewable Energies",
  booktitle="25th European Photovoltaic Solar Energy Conference (id 18618)",
  chapter="35590",
  howpublished="print",
  institution="WIP - Renewable Energies",
  year="2010",
  month="september",
  pages="351--354",
  publisher="WIP - Renewable Energies",
  type="conference paper"
}