Publication detail

Reverse-biased solar cell light emission thermal dependency

ŠKARVADA, P. TOMÁNEK, P.

Original Title

Reverse-biased solar cell light emission thermal dependency

English Title

Reverse-biased solar cell light emission thermal dependency

Type

conference paper

Language

en

Original Abstract

We present experimental data of light emission measurement from reverse-biased monocrystalline solar cell samples. Using high sensitivity light detection technique (cooled PMT in photon counting regime), some spots appearing in low reverse voltage Ur = 1.9 V have been found. Thermal dependency of light emission from bulk and edge defects shows different characteristics, respectively. Therefore not all of the light emitting spots in visible range are connected with avalanche multiplication or microplasmas. This measurement proves that all defects in the cell are not of the same nature.

English abstract

We present experimental data of light emission measurement from reverse-biased monocrystalline solar cell samples. Using high sensitivity light detection technique (cooled PMT in photon counting regime), some spots appearing in low reverse voltage Ur = 1.9 V have been found. Thermal dependency of light emission from bulk and edge defects shows different characteristics, respectively. Therefore not all of the light emitting spots in visible range are connected with avalanche multiplication or microplasmas. This measurement proves that all defects in the cell are not of the same nature.

Keywords

Solar cell, light emission, thermal dependency

RIV year

2010

Released

02.09.2010

Publisher

Novpress

Location

Brno

ISBN

978-80-214-4138-5

Book

Electronic Devices and Systems EDS10

Pages from

304

Pages to

307

Pages count

4

BibTex


@inproceedings{BUT35589,
  author="Pavel {Škarvada} and Pavel {Tománek}",
  title="Reverse-biased solar cell light emission thermal dependency",
  annote="We present experimental data of light emission measurement from reverse-biased monocrystalline solar cell samples. Using high sensitivity light detection technique (cooled PMT in photon counting regime), some spots appearing in low reverse voltage Ur = 1.9 V have been found. Thermal dependency of light emission from bulk and edge defects shows different characteristics, respectively.  Therefore not all of the light emitting spots in visible range are connected with avalanche multiplication or microplasmas. This measurement proves that all defects in the cell are not of the same nature.",
  address="Novpress",
  booktitle="Electronic Devices and Systems EDS10",
  chapter="35589",
  howpublished="print",
  institution="Novpress",
  year="2010",
  month="september",
  pages="304--307",
  publisher="Novpress",
  type="conference paper"
}