Publication detail

Light emission from silicon solar cells as characterization technique

ŠKARVADA, P. TOMÁNEK, P. KOKTAVÝ, P. MACKŮ, R.

Original Title

Light emission from silicon solar cells as characterization technique

English Title

Light emission from silicon solar cells as characterization technique

Type

conference paper

Language

en

Original Abstract

The paper describes local photoelectric measurement results obtained with monocrystalline silicon solar cell in visible light. The measurement allows localize, with high spatial resolution, a weak light emission from defects at reverse bias voltage as low as 3 V, which does not exhibit any relation to current-voltage characteristics (no local breakdowns). Other types of defects observed under forward bias using electroluminescence (EL) and light induced beam current (LBIC) techniques are also visualized. The measurements should contribute to find a correlation between EL and modified LBIC results.

English abstract

The paper describes local photoelectric measurement results obtained with monocrystalline silicon solar cell in visible light. The measurement allows localize, with high spatial resolution, a weak light emission from defects at reverse bias voltage as low as 3 V, which does not exhibit any relation to current-voltage characteristics (no local breakdowns). Other types of defects observed under forward bias using electroluminescence (EL) and light induced beam current (LBIC) techniques are also visualized. The measurements should contribute to find a correlation between EL and modified LBIC results.

Keywords

silicon solar cell; characterization; light emission; defects

RIV year

2010

Released

19.05.2010

Publisher

Reprotechnika Wroclaw

Location

Wroclaw

ISBN

978-1-4244-5371-9

Book

2010 9th International Conference on Environment and Electrical Engineering

Pages from

97

Pages to

100

Pages count

4

BibTex


@inproceedings{BUT35588,
  author="Pavel {Škarvada} and Pavel {Tománek} and Pavel {Koktavý} and Robert {Macků}",
  title="Light emission from silicon solar cells as characterization technique",
  annote="The paper describes local photoelectric measurement results obtained with monocrystalline silicon solar cell in visible light. The measurement allows localize, with high spatial resolution, a weak light emission from defects at reverse bias voltage as low as 3 V, which does not exhibit any relation to current-voltage characteristics (no local breakdowns). Other types of defects observed under forward bias using electroluminescence (EL) and light induced beam current (LBIC) techniques are also visualized. The measurements should contribute to find a correlation between EL and modified LBIC results.",
  address="Reprotechnika Wroclaw",
  booktitle="2010 9th International Conference on Environment and Electrical Engineering",
  chapter="35588",
  howpublished="online",
  institution="Reprotechnika Wroclaw",
  year="2010",
  month="may",
  pages="97--100",
  publisher="Reprotechnika Wroclaw",
  type="conference paper"
}