Publication detail

Noise of Reverse Biased Solar Cells

ŠKARVADA, P. MACKŮ, R. KOKTAVÝ, P. RAŠKA, M.

Original Title

Noise of Reverse Biased Solar Cells

English Title

Noise of Reverse Biased Solar Cells

Type

conference paper

Language

en

Original Abstract

The non-destructive testing and analysis of single crystal silicon solar cell is the focal point of our research. The noise spectroscopy and I-V curve measurement of reverse biased pn junction provide information that is connected with solar cell reliability and that provide for not only local defect characterization. We propose a new electric solar cell model, as a base for an enhanced noise model, which is in accordance with the experimentally obtained I-V curves. We suggest the physical nature of an unconventional behavior in reverse I-V characteristics, which is typical for solar cells without apparent local avalanche breakdowns.

English abstract

The non-destructive testing and analysis of single crystal silicon solar cell is the focal point of our research. The noise spectroscopy and I-V curve measurement of reverse biased pn junction provide information that is connected with solar cell reliability and that provide for not only local defect characterization. We propose a new electric solar cell model, as a base for an enhanced noise model, which is in accordance with the experimentally obtained I-V curves. We suggest the physical nature of an unconventional behavior in reverse I-V characteristics, which is typical for solar cells without apparent local avalanche breakdowns.

Keywords

Solar cell, pn junction, noise

RIV year

2009

Released

14.06.2009

Publisher

American Institute of Physics

Location

U.S.A.

ISBN

978-0-7354-0665-0

Book

Noise and Fluctuations ICNF2009

Pages from

391

Pages to

394

Pages count

4

BibTex


@inproceedings{BUT35487,
  author="Pavel {Škarvada} and Robert {Macků} and Pavel {Koktavý} and Michal {Raška}",
  title="Noise of Reverse Biased Solar Cells",
  annote="The non-destructive testing and analysis of single crystal silicon solar cell is the focal point of our research. The noise spectroscopy and I-V curve measurement of reverse biased pn junction provide information that is connected with solar cell reliability and that provide for not only local defect characterization. We propose a new electric solar cell model, as a base for an enhanced noise model, which is in accordance with the experimentally obtained I-V curves. We suggest the physical nature of an unconventional behavior in reverse I-V characteristics, which is typical for solar cells without apparent local avalanche breakdowns.",
  address="American Institute of Physics",
  booktitle="Noise and Fluctuations ICNF2009",
  chapter="35487",
  howpublished="electronic, physical medium",
  institution="American Institute of Physics",
  journal="AIP conference proceedings",
  number="1",
  year="2009",
  month="june",
  pages="391--394",
  publisher="American Institute of Physics",
  type="conference paper"
}