Publication detail

Diagnostics of Forward Biased Silicon Solar Cells Using Noise Spectroscopy

MACKŮ, R. KOKTAVÝ, P. ŠKARVADA, P. RAŠKA, M. SADOVSKÝ, P.

Original Title

Diagnostics of Forward Biased Silicon Solar Cells Using Noise Spectroscopy

English Title

Diagnostics of Forward Biased Silicon Solar Cells Using Noise Spectroscopy

Type

conference paper

Language

en

Original Abstract

Our research is above all focused on non-destructive testing of the solar cells. We study a single-crystal silicon solar cells n+p and we don't have serious information about features of a pn junction and impurities distribution. The main point of our study is characterization of the local defects in samples. These defects lead to live-time reduction and degradation of reliability. Flicker noise in forward biased solar cells is subject of this paper. We will discuss our measurement with Kleinpenning approaches for inhomogeneous semiconductors and we suggest the physical nature of the samples behaviour.

English abstract

Our research is above all focused on non-destructive testing of the solar cells. We study a single-crystal silicon solar cells n+p and we don't have serious information about features of a pn junction and impurities distribution. The main point of our study is characterization of the local defects in samples. These defects lead to live-time reduction and degradation of reliability. Flicker noise in forward biased solar cells is subject of this paper. We will discuss our measurement with Kleinpenning approaches for inhomogeneous semiconductors and we suggest the physical nature of the samples behaviour.

Keywords

Solar cell, flicker noise, shot noise, transport mechanism

RIV year

2009

Released

14.06.2009

Publisher

American Institute of Physics

Location

U.S.A.

ISBN

978-0-7354-0665-0

Book

Noise and Fluctuations, ICNF 2009

Pages from

145

Pages to

148

Pages count

4

BibTex


@inproceedings{BUT34758,
  author="Robert {Macků} and Pavel {Koktavý} and Pavel {Škarvada} and Michal {Raška} and Petr {Sadovský}",
  title="Diagnostics of Forward Biased Silicon Solar Cells Using Noise Spectroscopy",
  annote="Our research is above all focused on non-destructive testing of the solar cells. We study a single-crystal silicon solar cells n+p and we don't have serious information about features of a pn junction and impurities distribution. The main point of our study is characterization of the local defects in samples. These defects lead to live-time reduction and degradation of reliability. Flicker noise in forward biased solar cells is subject of this paper. We will discuss our measurement with Kleinpenning approaches for inhomogeneous semiconductors and we suggest the physical nature of the samples behaviour.",
  address="American Institute of Physics",
  booktitle="Noise and Fluctuations, ICNF 2009",
  chapter="34758",
  howpublished="print",
  institution="American Institute of Physics",
  number="1",
  year="2009",
  month="june",
  pages="145--148",
  publisher="American Institute of Physics",
  type="conference paper"
}