Publication detail

Transport and Noise Characteristics of Niobium Oxide and Tantalum Capacitors

ŠIKULA, J. SEDLÁKOVÁ, V. HLÁVKA, J. HÖSCHEL, P. SITA, Z. ZEDNÍČEK, T. TACANO, M. HASHIGUCHI, S.

Original Title

Transport and Noise Characteristics of Niobium Oxide and Tantalum Capacitors

English Title

Transport and Noise Characteristics of Niobium Oxide and Tantalum Capacitors

Type

conference paper

Language

en

Original Abstract

The aim of this paper is to characterize the active region quality of NbO and Ta capacitors. This method for assesment of defects in active region of NbO and Ta capacitors is based on the evaluation of VA and noise characteristics and theirs temperature dependences.

English abstract

The aim of this paper is to characterize the active region quality of NbO and Ta capacitors. This method for assesment of defects in active region of NbO and Ta capacitors is based on the evaluation of VA and noise characteristics and theirs temperature dependences.

Keywords

Low frequency noise, NbO, Ta

RIV year

2005

Released

01.01.2005

Pages from

210

Pages to

215

Pages count

6

BibTex


@inproceedings{BUT31369,
  author="Josef {Šikula} and Vlasta {Sedláková} and Jan {Hlávka} and Pavel {Höschel} and Zdeněk {Sita} and Tomáš {Zedníček} and Munecazu {Tacano} and Sumihisa {Hashiguchi}",
  title="Transport and Noise Characteristics of Niobium Oxide and Tantalum Capacitors",
  annote="The aim of this paper is to characterize the active region quality of NbO and Ta capacitors. This method for assesment of defects in active region of NbO and Ta capacitors is based on the evaluation of VA and noise characteristics and theirs temperature dependences.",
  booktitle="25th Capacitor and Resistor Technology Symposium",
  chapter="31369",
  number="10",
  year="2005",
  month="january",
  pages="210",
  type="conference paper"
}