Publication detail

Modeling of Current Density in Thick Film Resistors

PULEC, J. SZENDIUCH, I.

Original Title

Modeling of Current Density in Thick Film Resistors

English Title

Modeling of Current Density in Thick Film Resistors

Type

conference paper

Language

en

Original Abstract

This paper describes various methods for setting of desirable value of resistance in thick film resistors. In this ways adjusted resistors are next created and analyzed in view of maximum current density in them. Methods are compared and it is selected the optimal from them.

English abstract

This paper describes various methods for setting of desirable value of resistance in thick film resistors. In this ways adjusted resistors are next created and analyzed in view of maximum current density in them. Methods are compared and it is selected the optimal from them.

Keywords

thick film technology, current density, relibility, simulation

RIV year

2010

Released

29.04.2010

Publisher

NOVPRESS

Location

Brno

ISBN

978-80-214-4079-1

Book

STUDENT EEICT 2010

Edition number

1

Pages from

236

Pages to

240

Pages count

5

BibTex


@inproceedings{BUT29968,
  author="Jiří {Pulec} and Ivan {Szendiuch}",
  title="Modeling of Current Density in Thick Film Resistors",
  annote="This paper describes various methods for setting of desirable value of resistance in thick film resistors. In this ways adjusted resistors are next created and analyzed in view of maximum current density in them. Methods are compared and it is selected the optimal from them.",
  address="NOVPRESS",
  booktitle="STUDENT EEICT 2010",
  chapter="29968",
  howpublished="print",
  institution="NOVPRESS",
  year="2010",
  month="april",
  pages="236--240",
  publisher="NOVPRESS",
  type="conference paper"
}