Publication detail

Cold Emission Cathodes Noise Characteristics

KNÁPEK, A.

Original Title

Cold Emission Cathodes Noise Characteristics

English Title

Cold Emission Cathodes Noise Characteristics

Type

conference paper

Language

en

Original Abstract

The paper introduces a method for deposition thick oxide layer on to the cold emission cathode and its noise diagnostics. Cathodes based on the Schottky emission are predominant electron source technology for scanning electron microscopy (SEM), transmission electron microscopy (TEM) and Auger systems. Achieving proper results requires an electron source with the following ideal properties: small source size, low electron emission energy spread, high brightness, low noise and long-term stability, simple and low-cost operation. Deposited oxide layer allows to significantly lower work function, which is necessary for increasing cold electron emission current.

English abstract

The paper introduces a method for deposition thick oxide layer on to the cold emission cathode and its noise diagnostics. Cathodes based on the Schottky emission are predominant electron source technology for scanning electron microscopy (SEM), transmission electron microscopy (TEM) and Auger systems. Achieving proper results requires an electron source with the following ideal properties: small source size, low electron emission energy spread, high brightness, low noise and long-term stability, simple and low-cost operation. Deposited oxide layer allows to significantly lower work function, which is necessary for increasing cold electron emission current.

Keywords

coldemission cathode, noise diagnostics, electron source

RIV year

2010

Released

29.04.2010

Publisher

NOVPRESS s.r.o

Location

Brno, 2010

ISBN

978-80-214-4080-7

Book

Proceedings of the 16th Conference Student EEICT 2010

Edition

Volume 5

Edition number

první

Pages from

94

Pages to

98

Pages count

5

BibTex


@inproceedings{BUT29903,
  author="Alexandr {Knápek}",
  title="Cold Emission Cathodes Noise Characteristics",
  annote="The paper introduces a method for deposition thick oxide layer on to the cold emission cathode and its noise diagnostics. Cathodes based on the Schottky emission are predominant electron source technology for scanning electron microscopy (SEM), transmission electron microscopy (TEM) and Auger systems. Achieving proper results requires an electron source with the following ideal properties: small source size, low electron emission energy spread, high brightness, low noise and long-term stability, simple and low-cost operation. Deposited oxide layer allows to significantly lower work function, which is necessary for increasing cold electron emission current.",
  address="NOVPRESS s.r.o",
  booktitle="Proceedings of the 16th Conference Student EEICT 2010",
  chapter="29903",
  edition="Volume 5",
  howpublished="print",
  institution="NOVPRESS s.r.o",
  year="2010",
  month="april",
  pages="94--98",
  publisher="NOVPRESS s.r.o",
  type="conference paper"
}