Publication detail

Test Frequency Selection for Band-Pass Filters

KINCL, Z. KOLKA, Z.

Original Title

Test Frequency Selection for Band-Pass Filters

English Title

Test Frequency Selection for Band-Pass Filters

Type

conference paper

Language

en

Original Abstract

The paper discusses the selection of an appropriate set of test frequencies in the multifrequency parametric fault diagnosis of band-pass filters. Selected frequencies depend on the filter quality factor Q and they are the same for all groups of testable components. The selection of single frequency and double frequencies is shown for the second-order band-pass filter in the current-mode. The method can be used either to locate faulty components or to estimate a priori unknown parasitic parameters of active circuit elements.

English abstract

The paper discusses the selection of an appropriate set of test frequencies in the multifrequency parametric fault diagnosis of band-pass filters. Selected frequencies depend on the filter quality factor Q and they are the same for all groups of testable components. The selection of single frequency and double frequencies is shown for the second-order band-pass filter in the current-mode. The method can be used either to locate faulty components or to estimate a priori unknown parasitic parameters of active circuit elements.

Keywords

Analog fault diagnosis, frequency set selection, test error index, frequency filter.

RIV year

2010

Released

16.04.2010

Publisher

Brno University of Technology

Location

Brno, Czech Republic

ISBN

978-1-4244-6319-0

Book

20th International Conference RADIOELEKTRONIKA 2010

Pages from

173

Pages to

176

Pages count

4

Documents

BibTex 


@inproceedings{BUT29464,
  author="Zdeněk {Kincl} and Zdeněk {Kolka}",
  title="Test Frequency Selection for Band-Pass Filters",
  annote="The paper discusses the selection of an appropriate set of test frequencies in the multifrequency parametric fault diagnosis of band-pass filters. Selected frequencies depend on the filter quality factor Q and they are the same for all groups of testable components. The selection of single frequency and double frequencies is shown for the second-order band-pass filter in the current-mode. The method can be used either to locate faulty components or to estimate a priori unknown parasitic parameters of active circuit elements.",
  address="Brno University of Technology",
  booktitle="20th International Conference RADIOELEKTRONIKA 2010",
  chapter="29464",
  howpublished="print",
  institution="Brno University of Technology",
  year="2010",
  month="april",
  pages="173--176",
  publisher="Brno University of Technology",
  type="conference paper"
}