Publication detail

Extended electrical and thermal properties of single junction silicon solar cells

MACKŮ, R.

Original Title

Extended electrical and thermal properties of single junction silicon solar cells

English Title

Extended electrical and thermal properties of single junction silicon solar cells

Type

conference paper

Language

en

Original Abstract

This paper reports an electrical measurement of the single junction solar cells based on silicon technology. Defects of these samples are often local and can result in lower efficiency or shorter solar cell lifetime. Consequently, we can observe many of defects in electric characteristics of solar cells. Measured IV-characteristics and noise signals provide information for defects classification and/or identification. The results of two basic types of the silicon solar cells measurements at very low temperatures are presented in this paper. Used types of solar cells differ above all in the surface texturing and dopand concentration. The cryogenic system is used to accurate setting of temperature with wide range of operating temperatures. The microscopic study of the samples surface is presented, too.

English abstract

This paper reports an electrical measurement of the single junction solar cells based on silicon technology. Defects of these samples are often local and can result in lower efficiency or shorter solar cell lifetime. Consequently, we can observe many of defects in electric characteristics of solar cells. Measured IV-characteristics and noise signals provide information for defects classification and/or identification. The results of two basic types of the silicon solar cells measurements at very low temperatures are presented in this paper. Used types of solar cells differ above all in the surface texturing and dopand concentration. The cryogenic system is used to accurate setting of temperature with wide range of operating temperatures. The microscopic study of the samples surface is presented, too.

Keywords

Solar cell, noise, breakdown, PN junction, transport mechanisms

RIV year

2009

Released

10.04.2009

Publisher

VUT v Brně

Location

Brno

ISBN

978-80-214-3869-9

Book

Proceedings of the 15th conference Student EEICT 2009

Edition number

1

Pages from

208

Pages to

212

Pages count

5

BibTex


@inproceedings{BUT29146,
  author="Robert {Macků}",
  title="Extended electrical and thermal properties of single junction silicon solar cells",
  annote="This paper reports an electrical measurement of the single junction solar cells based on silicon technology. Defects of these samples are often local and can result in lower efficiency or shorter solar cell lifetime. Consequently, we can observe many of defects in electric characteristics of solar cells. Measured IV-characteristics and noise signals provide information for defects classification and/or identification. The results of two basic types of the silicon solar cells measurements at very low temperatures are presented in this paper. Used types of solar cells differ above all in the surface texturing and dopand concentration. The cryogenic system is used to accurate setting of temperature with wide range of operating temperatures. The microscopic study of the samples surface is presented, too.",
  address="VUT v Brně",
  booktitle="Proceedings of the 15th conference Student EEICT 2009",
  chapter="29146",
  howpublished="print",
  institution="VUT v Brně",
  year="2009",
  month="april",
  pages="208--212",
  publisher="VUT v Brně",
  type="conference paper"
}