Publication detail

Device for statistical characteristics of microplasma noise measurment

MACKŮ, R. KOKTAVÝ, P.

Original Title

Device for statistical characteristics of microplasma noise measurment

English Title

Device for statistical characteristics of microplasma noise measurment

Type

conference paper

Language

en

Original Abstract

Random two-level current impulses may occur in electronic devices containing reverse biased p-n junctions in a certain operating mode. These impulses are usually rectangular, featuring constant amplitude, random pulse width and pulse origin time points. Based on experiment results, a two-state model of stochastic generation-recombination process has been elaborated for the two-level impulse noise allowing to derive some statistical characteristics of this process. A device for measurement of statistical characteristics in a wide range of time is described in this paper. Thus obtained results may be used for p-n junction non-destructive diagnostics and quality assessment.

English abstract

Random two-level current impulses may occur in electronic devices containing reverse biased p-n junctions in a certain operating mode. These impulses are usually rectangular, featuring constant amplitude, random pulse width and pulse origin time points. Based on experiment results, a two-state model of stochastic generation-recombination process has been elaborated for the two-level impulse noise allowing to derive some statistical characteristics of this process. A device for measurement of statistical characteristics in a wide range of time is described in this paper. Thus obtained results may be used for p-n junction non-destructive diagnostics and quality assessment.

Keywords

Microplasma noise, Statistical characteristics, A-type noise, Impulse duration, Impulse separation

RIV year

2007

Released

15.11.2007

Publisher

Z. Novotný, Ing., CSc.

Location

Brno

ISBN

978-80-7355-078-3

Book

New trends in physics

Edition

-

Edition number

první

Pages from

90

Pages to

93

Pages count

4

BibTex


@inproceedings{BUT28511,
  author="Robert {Macků} and Pavel {Koktavý}",
  title="Device for statistical characteristics of microplasma noise measurment",
  annote="Random two-level current impulses may occur in electronic devices containing reverse biased p-n junctions in a certain operating mode. These impulses are usually rectangular, featuring constant amplitude, random pulse width and pulse origin time points. Based on experiment results, a two-state model of stochastic generation-recombination process has been elaborated for the two-level impulse noise allowing to derive some statistical characteristics of this process. A device for measurement of statistical characteristics in a wide range of time is described in this paper. Thus obtained results may be used for p-n junction non-destructive diagnostics and quality assessment.",
  address="Z. Novotný, Ing., CSc.",
  booktitle="New trends in physics",
  chapter="28511",
  edition="-",
  institution="Z. Novotný, Ing., CSc.",
  year="2007",
  month="november",
  pages="90--93",
  publisher="Z. Novotný, Ing., CSc.",
  type="conference paper"
}