Publication detail

Study of local properties of silicon solar cells

ŠKARVADA, P. TOMÁNEK, P. MACKŮ, R.

Original Title

Study of local properties of silicon solar cells

English Title

Study of local properties of silicon solar cells

Type

conference paper

Language

en

Original Abstract

Study of optical and photoelectrical properties of solar cells is important for cell development and its optimizing. A scanning near-field optical microscope (SNOM) proves to be an invaluable tool for studying (not only) monocrystalline silicon solar cells in microscale resolution. It does not reach as high a resolution as the atomic force microscope (AFM), but it makes the local optical excitation of specimen possible. With regard to the nature of the surface of the solar cell under investigation, the resolution of modified SNOM is more than sufficient. Topography, local reflective power and electrical response measurements of the solar cell are performed in the microscale, even nanoscale resolution. Lock-in nanovoltmetr is used for solar cell local electric response measurement. All of the mentioned measurements can be carried out simultaneously at the same point of the solar cell surface, which is a great benefit of this method. Relationships between the images obtained in the various measurements can easily be evaluated. We have investigated at which points of the surface the efficiency of the optical radiation to electric energy conversion is maximum and tried to identify structure defects in the surface.

English abstract

Study of optical and photoelectrical properties of solar cells is important for cell development and its optimizing. A scanning near-field optical microscope (SNOM) proves to be an invaluable tool for studying (not only) monocrystalline silicon solar cells in microscale resolution. It does not reach as high a resolution as the atomic force microscope (AFM), but it makes the local optical excitation of specimen possible. With regard to the nature of the surface of the solar cell under investigation, the resolution of modified SNOM is more than sufficient. Topography, local reflective power and electrical response measurements of the solar cell are performed in the microscale, even nanoscale resolution. Lock-in nanovoltmetr is used for solar cell local electric response measurement. All of the mentioned measurements can be carried out simultaneously at the same point of the solar cell surface, which is a great benefit of this method. Relationships between the images obtained in the various measurements can easily be evaluated. We have investigated at which points of the surface the efficiency of the optical radiation to electric energy conversion is maximum and tried to identify structure defects in the surface.

Keywords

Scanning Near-field Optical Microscope, Silicon Solar Cell, Photoelectric properties

RIV year

2008

Released

01.10.2008

Publisher

WIP - Renewable Energies

Location

Valencia Spain

ISBN

3-936338-24-8

Book

Proceeding of 23rd European Photovoltaic Solar Energy Conference

Pages from

1644

Pages to

1647

Pages count

4

BibTex


@inproceedings{BUT27575,
  author="Pavel {Škarvada} and Pavel {Tománek} and Robert {Macků}",
  title="Study of local properties of silicon solar cells",
  annote="Study of optical and photoelectrical properties of solar cells is important for cell development and its optimizing. A scanning near-field optical microscope (SNOM) proves to be an invaluable tool for studying (not only) monocrystalline silicon solar cells in microscale resolution. It does not reach as high a resolution as the atomic force microscope (AFM), but it makes the local optical excitation of specimen possible. With regard to the nature of the surface of the solar cell under investigation, the resolution of modified SNOM is more than sufficient. Topography, local reflective power and electrical response measurements of the solar cell are performed in the microscale, even nanoscale resolution. Lock-in nanovoltmetr is used for solar cell local electric response measurement. All of the mentioned measurements can be carried out simultaneously at the same point of the solar cell surface, which is a great benefit of this method. Relationships between the images obtained in the various measurements can easily be evaluated. We have investigated at which points of the surface the efficiency of the optical radiation to electric
energy conversion is maximum and tried to identify structure defects in the surface.",
  address="WIP - Renewable Energies",
  booktitle="Proceeding of 23rd European Photovoltaic Solar Energy Conference",
  chapter="27575",
  howpublished="electronic, physical medium",
  institution="WIP - Renewable Energies",
  year="2008",
  month="october",
  pages="1644--1647",
  publisher="WIP - Renewable Energies",
  type="conference paper"
}