Publication detail

Diagnostics of solar cells in spectral domain

MACKŮ, R.

Original Title

Diagnostics of solar cells in spectral domain

English Title

Diagnostics of solar cells in spectral domain

Type

conference paper

Language

en

Original Abstract

Our research is focused on the silicon monocrystalline solar sells and this article briefly deals with non-destructive solar cells testing via noise measurement. Several kinds of noise have been discovered. The microplasma noise is patterned with our solar cells samples and it originates in consequence local avalanche breakdowns. Another noise type probably originates as a result of thermal processes. There is shown spectral analysis utilization for classification and description noises in this article.

English abstract

Our research is focused on the silicon monocrystalline solar sells and this article briefly deals with non-destructive solar cells testing via noise measurement. Several kinds of noise have been discovered. The microplasma noise is patterned with our solar cells samples and it originates in consequence local avalanche breakdowns. Another noise type probably originates as a result of thermal processes. There is shown spectral analysis utilization for classification and description noises in this article.

Keywords

Solar cell, noise, miclopasma noise, breakdown, PN junction

RIV year

2008

Released

10.04.2008

Publisher

VUT v Brně

Location

Brno

ISBN

978-80-214-3617-6

Book

Proceedings of the 14th conference Student EEICT 2008

Edition number

4

Pages from

366

Pages to

369

Pages count

4

BibTex


@inproceedings{BUT26358,
  author="Robert {Macků}",
  title="Diagnostics of solar cells in spectral domain",
  annote="Our research is focused on the silicon monocrystalline solar sells and this article briefly deals with non-destructive solar cells testing via noise measurement. Several kinds of noise have been discovered. The microplasma noise is patterned with our solar cells samples and it originates in consequence local avalanche breakdowns. Another noise type probably originates as a result of thermal processes. There is shown spectral analysis utilization for classification and description noises in this article.",
  address="VUT v Brně",
  booktitle="Proceedings of the 14th conference Student EEICT 2008",
  chapter="26358",
  howpublished="print",
  institution="VUT v Brně",
  year="2008",
  month="april",
  pages="366--369",
  publisher="VUT v Brně",
  type="conference paper"
}