Publication detail

Noise diagnostics of local defects in solar cells

KOKTAVÝ, P. KOKTAVÝ, B. MACKŮ, R. SADOVSKÝ, P.

Original Title

Noise diagnostics of local defects in solar cells

English Title

Noise diagnostics of local defects in solar cells

Type

conference paper

Language

en

Original Abstract

This study deals with the use of noise for solar cells diagnostic purposes. When a high electric field is applied to a PN junction containing some technological imperfections, local breakdowns arises in micro-sized regions, which in turn can lead to the deterioration in quality or destruction of the PN junction. It is therefore advisable to use methods which can indicate the presence of these regions in the junction and make the quality assessment and quantitative description of the tested cells possible.

English abstract

This study deals with the use of noise for solar cells diagnostic purposes. When a high electric field is applied to a PN junction containing some technological imperfections, local breakdowns arises in micro-sized regions, which in turn can lead to the deterioration in quality or destruction of the PN junction. It is therefore advisable to use methods which can indicate the presence of these regions in the junction and make the quality assessment and quantitative description of the tested cells possible.

Keywords

Solar cell, microplasma noise, noise diagnostics

RIV year

2007

Released

20.09.2007

Publisher

IMAPS CS

Location

Brno

ISBN

978-80-214-3470-7

Book

Proc. of EDS IMAPS CS 2007

Pages from

409

Pages to

413

Pages count

5

BibTex


@inproceedings{BUT25515,
  author="Pavel {Koktavý} and Bohumil {Koktavý} and Robert {Macků} and Petr {Sadovský}",
  title="Noise diagnostics of local defects in solar cells",
  annote="This study deals with the use of noise for solar cells diagnostic purposes. When a high electric field is applied to a PN junction containing some technological imperfections, local breakdowns arises in micro-sized regions, which in turn can lead to the deterioration in quality or destruction of the PN junction. It is therefore advisable to use methods which can indicate the presence of these regions in the junction and make the quality assessment and quantitative description of the tested cells possible.",
  address="IMAPS CS",
  booktitle="Proc. of EDS IMAPS CS 2007",
  chapter="25515",
  institution="IMAPS CS",
  year="2007",
  month="september",
  pages="409--413",
  publisher="IMAPS CS",
  type="conference paper"
}