Publication detail

Electrochemical measurement System Based on Thick-Film Sensors

Steffan P., Hubalek J., Ficek R., Vrba R.

Original Title

Electrochemical measurement System Based on Thick-Film Sensors

English Title

Electrochemical measurement System Based on Thick-Film Sensors

Type

conference paper

Language

en

Original Abstract

A new electroanalytical measurement system (micropotentiostat) for electrochemical analysis was designed onto a microchip. The microchip was fabricated in CMOS technology AMIS 0.7 and can store correction data in integrated PROM memory. The microchip was implemented on thick-film sensor to provide potentiometric measurements as cyclic voltammetry, amperommetry, etc. The measurement can be done at wide dynamic range with 8 orders of a current range.

English abstract

A new electroanalytical measurement system (micropotentiostat) for electrochemical analysis was designed onto a microchip. The microchip was fabricated in CMOS technology AMIS 0.7 and can store correction data in integrated PROM memory. The microchip was implemented on thick-film sensor to provide potentiometric measurements as cyclic voltammetry, amperommetry, etc. The measurement can be done at wide dynamic range with 8 orders of a current range.

RIV year

2006

Released

18.10.2006

Publisher

IEEE

Location

Thailand, Bangkok

ISBN

0-7803-9741-X

Book

International Symposium on Communications and Information Technologies 2006

Edition number

1.

Pages from

F1C-12

Pages count

4

BibTex


@inproceedings{BUT24822,
  author="Pavel {Šteffan} and Richard {Ficek} and Jaromír {Hubálek} and Radimír {Vrba}",
  title="Electrochemical measurement System Based on Thick-Film Sensors",
  annote="A new electroanalytical measurement system (micropotentiostat) for electrochemical analysis was designed onto a microchip. The microchip was fabricated in CMOS technology AMIS 0.7 and can store correction data in integrated PROM memory. The microchip was implemented on thick-film sensor to provide potentiometric measurements as cyclic voltammetry, amperommetry, etc. The measurement can be done at wide dynamic range with 8 orders of a current range.",
  address="IEEE",
  booktitle="International Symposium on Communications and Information Technologies 2006",
  chapter="24822",
  institution="IEEE",
  year="2006",
  month="october",
  pages="F1C-12",
  publisher="IEEE",
  type="conference paper"
}