Publication detail

Study of Sputtered Passivation Layers Properties by means of MW-PCD Measurement

HÉGR, O.

Original Title

Study of Sputtered Passivation Layers Properties by means of MW-PCD Measurement

English Title

Study of Sputtered Passivation Layers Properties by means of MW-PCD Measurement

Type

conference paper

Language

en

Original Abstract

In this work we described measurement method for determine one of recombination parameters. For determination of lifetime minority carrier we used very know microwave-detected photoconductance decay (MW-PCD). The layers of SiNx were sputtered by means of RF magnetron. The aim of work was evaluation of both front and back side surface recombinations and optical properties of sputtered layers and their comparison with passivatinon layers on standard solar cells made by Solartec company (Czech republic).

English abstract

In this work we described measurement method for determine one of recombination parameters. For determination of lifetime minority carrier we used very know microwave-detected photoconductance decay (MW-PCD). The layers of SiNx were sputtered by means of RF magnetron. The aim of work was evaluation of both front and back side surface recombinations and optical properties of sputtered layers and their comparison with passivatinon layers on standard solar cells made by Solartec company (Czech republic).

Keywords

solar cell, surface passivation, antireflection coating, silicon nitride

RIV year

2007

Released

01.01.2007

ISBN

978-80-214-3410-3

Book

Student EEICT 2007, Volume 4

Pages from

313

Pages to

317

Pages count

4

BibTex


@inproceedings{BUT22994,
  author="Ondřej {Hégr}",
  title="Study of Sputtered Passivation Layers Properties by means of MW-PCD Measurement",
  annote="In this work we described measurement method for determine one of recombination parameters. For determination of lifetime minority carrier we used very know microwave-detected photoconductance decay (MW-PCD). The layers of SiNx were sputtered by means of RF magnetron. The aim of work was evaluation of both front and back side surface recombinations and optical properties of sputtered layers and their comparison with passivatinon layers on standard solar cells made by Solartec company (Czech republic).",
  booktitle="Student EEICT 2007, Volume 4",
  chapter="22994",
  year="2007",
  month="january",
  pages="313--317",
  type="conference paper"
}