Publication detail

Microplasma Noise - Coefficients of Generation and Recombination

RAŠKA, M. HOLCMAN, V.

Original Title

Microplasma Noise - Coefficients of Generation and Recombination

English Title

Microplasma Noise - Coefficients of Generation and Recombination

Type

conference paper

Language

en

Original Abstract

The occurence of microplasma regions in PN junctions is attributed to crystal lattice imperfections. As a rule, these regions feature lower strong-field avalanche ionization breakdown voltages than other homogenous PN junction regions [1]. The existence of such regions may lead to local avalanche breakdowns occuring in reverse-biased PN junctions at certain voltage. These local avalanche breakdowns may exhibit as a current impulse noise. These impulses are usually represented by constant amplitude, random pulse width and pulse origin time points. The current impulse noise is dependent on voltage. When the reverse voltage on PN junction increases, frequency and width of impulses are also increasing. The microplasma bistable behaviour may be described with two-state stochastic process of generation-recombination type.

English abstract

The occurence of microplasma regions in PN junctions is attributed to crystal lattice imperfections. As a rule, these regions feature lower strong-field avalanche ionization breakdown voltages than other homogenous PN junction regions [1]. The existence of such regions may lead to local avalanche breakdowns occuring in reverse-biased PN junctions at certain voltage. These local avalanche breakdowns may exhibit as a current impulse noise. These impulses are usually represented by constant amplitude, random pulse width and pulse origin time points. The current impulse noise is dependent on voltage. When the reverse voltage on PN junction increases, frequency and width of impulses are also increasing. The microplasma bistable behaviour may be described with two-state stochastic process of generation-recombination type.

Keywords

mikroplazma

RIV year

2007

Released

01.01.2007

Publisher

Ing. Zdeněk Novotný CSc, Ondráčkova 105, Brno

Location

Brno

ISBN

978-80-214-3409-7

Book

Student EEICT 2007

Edition

3

Edition number

1

Pages from

356

Pages to

360

Pages count

4

BibTex


@inproceedings{BUT22993,
  author="Michal {Raška} and Vladimír {Holcman}",
  title="Microplasma Noise - Coefficients of Generation and Recombination",
  annote="The occurence of microplasma regions in PN junctions is attributed to crystal lattice imperfections.
As a rule, these regions feature lower strong-field avalanche ionization breakdown
voltages than other homogenous PN junction regions [1]. The existence
of such regions may lead to local avalanche breakdowns occuring in reverse-biased PN
junctions at certain voltage. These local avalanche breakdowns may exhibit as a current
impulse noise. These impulses are usually represented by constant amplitude, random
pulse width and pulse origin time points. The current impulse noise is dependent on voltage.
When the reverse voltage on PN junction increases, frequency and width of impulses
are also increasing. The microplasma bistable behaviour may be described with two-state
stochastic process of generation-recombination type.",
  address="Ing. Zdeněk Novotný CSc, Ondráčkova 105, Brno",
  booktitle="Student EEICT 2007",
  chapter="22993",
  edition="3",
  institution="Ing. Zdeněk Novotný CSc, Ondráčkova 105, Brno",
  year="2007",
  month="january",
  pages="356--360",
  publisher="Ing. Zdeněk Novotný CSc, Ondráčkova 105, Brno",
  type="conference paper"
}