Publication detail

Solar Cells Noise Diagnostic and LBIC Comparison

KOKTAVÝ, P. VANĚK, J. CHOBOLA, Z. JANDOVÁ, K. KAZELLE, J.

Original Title

Solar Cells Noise Diagnostic and LBIC Comparison

English Title

Solar Cells Noise Diagnostic and LBIC Comparison

Type

conference paper

Language

en

Original Abstract

Solar cells defects are diagnosed by LBIC characterization and noise spectrocopy. Low frequency noise is a more sensitive tool for analyzing of degradation phenomena, like electro migration and sort of brakdown. All type of noise - thermal, shot, generation, recombination and 1/f type on noise play a different role in reliabilty analysis. The correlation between noise and transport characteristic indicates possibility of this diagnostic tool. Therefore the noise spectroscopy and LBIC is a pair o f the very useful methods to provide a non-destructive charracterization on silicon semiconductor solar cells.

English abstract

Solar cells defects are diagnosed by LBIC characterization and noise spectrocopy. Low frequency noise is a more sensitive tool for analyzing of degradation phenomena, like electro migration and sort of brakdown. All type of noise - thermal, shot, generation, recombination and 1/f type on noise play a different role in reliabilty analysis. The correlation between noise and transport characteristic indicates possibility of this diagnostic tool. Therefore the noise spectroscopy and LBIC is a pair o f the very useful methods to provide a non-destructive charracterization on silicon semiconductor solar cells.

Keywords

noise spectroscopy, LBIC, solar cell

RIV year

2007

Released

09.09.2007

Publisher

AIP

Location

Melville, New York

ISBN

978-0-7354-0432-8

Book

Proceeding of AIP

Pages from

306

Pages to

309

Pages count

4

BibTex


@inproceedings{BUT22882,
  author="Pavel {Koktavý} and Jiří {Vaněk} and Zdeněk {Chobola} and Kristýna {Jandová} and Jiří {Kazelle}",
  title="Solar Cells Noise Diagnostic and LBIC Comparison",
  annote="Solar cells defects are diagnosed by LBIC characterization and noise spectrocopy. Low frequency noise is a more sensitive tool for analyzing of degradation phenomena, like electro migration and sort of brakdown. All type of noise - thermal, shot, generation, recombination and 1/f type on noise play a different role in reliabilty analysis. The correlation between noise and transport characteristic indicates possibility of this diagnostic tool. Therefore the noise spectroscopy and LBIC is a pair o f the very useful methods to provide a non-destructive charracterization on silicon semiconductor solar cells.",
  address="AIP",
  booktitle="Proceeding of AIP",
  chapter="22882",
  institution="AIP",
  year="2007",
  month="september",
  pages="306--309",
  publisher="AIP",
  type="conference paper"
}