Publication detail

Local opto-electronic characteristics of alternating current ZnS:Mn thin-film electroluminescent devices

AHMED, M. TOMÁNEK, P.

Original Title

Local opto-electronic characteristics of alternating current ZnS:Mn thin-film electroluminescent devices

English Title

Local opto-electronic characteristics of alternating current ZnS:Mn thin-film electroluminescent devices

Type

conference paper

Language

en

Original Abstract

New progress of ACTFEL technology is dependent on the development of novel processing techniques and new phosphor materials. The paper brings a short description of material requirements for the constituent layers of ACTFEL devices and of luminescent impurities commonly used in ACTFEL devices and their local electroluminescent measurement.

English abstract

New progress of ACTFEL technology is dependent on the development of novel processing techniques and new phosphor materials. The paper brings a short description of material requirements for the constituent layers of ACTFEL devices and of luminescent impurities commonly used in ACTFEL devices and their local electroluminescent measurement.

Keywords

ZnS:Mn phosphor, alternating-current thin-film electroluminescent, electroluminescence, photoluminescence, Scanning near-field optical microscopy

RIV year

2007

Released

19.01.2007

Publisher

Ing. Zdeněk Novotný, CSc., Ondráčkova 105, Brno

Location

Brno

ISBN

978-80-7355-075-2

Book

Nové trendy v mikroelektronických systémech a nanotechnologiích: moderní diagnostika materiálů a součástek Mikrosyn-2006

Pages from

93

Pages to

102

Pages count

10

BibTex


@inproceedings{BUT22767,
  author="Mustafa M. Abdalla {Ahmed} and Pavel {Tománek}",
  title="Local opto-electronic characteristics of alternating current ZnS:Mn thin-film electroluminescent devices",
  annote="New progress of ACTFEL technology is dependent on the development of novel processing techniques and new phosphor materials. The paper brings a short description of material requirements for the constituent layers of ACTFEL devices and of luminescent impurities commonly used in ACTFEL devices and their local electroluminescent measurement.",
  address="Ing. Zdeněk Novotný, CSc., Ondráčkova 105, Brno",
  booktitle="Nové trendy v mikroelektronických systémech a nanotechnologiích: moderní diagnostika materiálů a součástek Mikrosyn-2006",
  chapter="22767",
  institution="Ing. Zdeněk Novotný, CSc., Ondráčkova 105, Brno",
  year="2007",
  month="january",
  pages="93--102",
  publisher="Ing. Zdeněk Novotný, CSc., Ondráčkova 105, Brno",
  type="conference paper"
}