Publication detail

Measuring electronics for apex chip measuring unit

Magát M., Pavlík M., Vrba R.

Original Title

Measuring electronics for apex chip measuring unit

English Title

Measuring electronics for apex chip measuring unit

Type

conference paper

Language

en

Original Abstract

This article describes design and construction of the measuring electronics for the apex chip measuring unit. This was made out to ensure measurement of the tested chip parameters. It offers possibility to measuring produced chip parameters before its encapsulation and than reduces cost of wasters. The measured parameters are resistance, capacity and time dependent voltage. To ensure realistic working conditions the measuring electronics is able to generate specific electromagnetic field with defined temperature of the chip.

English abstract

This article describes design and construction of the measuring electronics for the apex chip measuring unit. This was made out to ensure measurement of the tested chip parameters. It offers possibility to measuring produced chip parameters before its encapsulation and than reduces cost of wasters. The measured parameters are resistance, capacity and time dependent voltage. To ensure realistic working conditions the measuring electronics is able to generate specific electromagnetic field with defined temperature of the chip.

Keywords

apex, tip, chip, measuring

RIV year

2006

Released

14.09.2006

Publisher

Vysoké učení technické v Brně, Antonínská 548/1

Location

Brno

ISBN

80-214-3246-2

Book

EDS'06 IMAPS CS INTERNATIONAL CONFERENCE PROCEEDINGS

Edition number

1

Pages from

30

Pages to

33

Pages count

4

BibTex


@inproceedings{BUT19154,
  author="Martin {Magát} and Michal {Pavlík} and Radimír {Vrba}",
  title="Measuring electronics for apex chip measuring unit",
  annote="This article describes design and construction of the measuring electronics for the apex chip measuring unit. This was made out to ensure measurement of the tested chip parameters. It offers possibility to measuring produced chip parameters before its encapsulation and than reduces cost of wasters. The measured parameters are resistance, capacity and time dependent voltage. To ensure realistic working conditions the measuring electronics is able to generate specific electromagnetic field with defined temperature of the chip.",
  address="Vysoké učení technické v Brně, Antonínská 548/1",
  booktitle="EDS'06 IMAPS CS INTERNATIONAL CONFERENCE PROCEEDINGS",
  chapter="19154",
  institution="Vysoké učení technické v Brně, Antonínská 548/1",
  year="2006",
  month="september",
  pages="30",
  publisher="Vysoké učení technické v Brně, Antonínská 548/1",
  type="conference paper"
}