Publication detail

Computer-Controlled measurement of VA Characteristics of Two-Port Devices

Jan Havránek, Jiří Zajaček

Original Title

Computer-Controlled measurement of VA Characteristics of Two-Port Devices

English Title

Computer-Controlled measurement of VA Characteristics of Two-Port Devices

Type

conference paper

Language

en

Original Abstract

Experimental study of residual currents and VA characteristics of electrolytic capacitors has been carried out. Fully automatic measuring apparatus which allow us to measure up to 20 samples at a time was constructed. This paper offers measuring system and apparatus descriptions and also presents determination of parameters for residual currents of tantalum capacitors. Measurement of residual currents which was provided on the ensemble of 140 samples is one of the promising non destructive testing methods to determinate reliability and dielectric layer quality.

English abstract

Experimental study of residual currents and VA characteristics of electrolytic capacitors has been carried out. Fully automatic measuring apparatus which allow us to measure up to 20 samples at a time was constructed. This paper offers measuring system and apparatus descriptions and also presents determination of parameters for residual currents of tantalum capacitors. Measurement of residual currents which was provided on the ensemble of 140 samples is one of the promising non destructive testing methods to determinate reliability and dielectric layer quality.

RIV year

2006

Released

27.04.2006

Publisher

VUT Brno

ISBN

80-214-3162-8

Book

STUDENT EEICT 2006

Pages from

161

Pages to

165

Pages count

5

BibTex


@inproceedings{BUT18497,
  author="Jan {Havránek} and Jiří {Zajaček}",
  title="Computer-Controlled measurement of VA Characteristics of Two-Port Devices",
  annote="Experimental study of residual currents and VA characteristics of electrolytic capacitors has been carried out. Fully automatic measuring apparatus which allow us to measure up to 20 samples at a time was constructed. This paper offers measuring system and apparatus descriptions and also presents determination of parameters for residual currents of tantalum capacitors. Measurement of residual currents which was provided on the ensemble of 140 samples is one of the promising non destructive testing methods to determinate reliability and dielectric layer quality.",
  address="VUT Brno",
  booktitle="STUDENT EEICT 2006",
  chapter="18497",
  institution="VUT Brno",
  year="2006",
  month="april",
  pages="161",
  publisher="VUT Brno",
  type="conference paper"
}