Publication detail

High-sensitivity mapping of magnetic induction fields with nanometer-scale resolution: comparison of off-axis electron holography and pixelated differential phase contrast

BOUREAU, V. STAŇO, M. Rouvière, J.-L. Toussaint, J.-C. Fruchart, O. Cooper, D

Original Title

High-sensitivity mapping of magnetic induction fields with nanometer-scale resolution: comparison of off-axis electron holography and pixelated differential phase contrast

English Title

High-sensitivity mapping of magnetic induction fields with nanometer-scale resolution: comparison of off-axis electron holography and pixelated differential phase contrast

Type

journal article in Web of Science

Language

en

Original Abstract

We compare two transmission electron microscopy (TEM) based techniques that can provide highly spatially resolved quantitative measurements of magnetic induction fields at high sensitivity. To this end, the magnetic induction of a ferromagnetic NiFe nanowire has been measured and compared to micromagnetic modeling. State-of-the-art off-axis electron holography has been performed using the averaging of large series of holograms to improve the sensitivity of the measurements. These results are then compared to those obtained from pixelated differential phase contrast, a technique that belongs to pixelated (or 4D) scanning transmission electron microscopy (STEM) experiments. This emerging technique uses a pixelated detector to image the local diffraction patterns as the beam is scanned over the sample. For each diffraction pattern, the deflection of the beam is measured and converted into magnetic induction, while scanning the beam allows a map to be generated. Aberration corrected Lorentz (field-free) configurations of the TEM and STEM were used for an improved spatial resolution. We show that the pixelated STEM approach, even when performed using an old generation of charge-coupled device camera, provides better sensitivity at the expense of spatial resolution. A more general comparison of the two quantitative techniques is given.

English abstract

We compare two transmission electron microscopy (TEM) based techniques that can provide highly spatially resolved quantitative measurements of magnetic induction fields at high sensitivity. To this end, the magnetic induction of a ferromagnetic NiFe nanowire has been measured and compared to micromagnetic modeling. State-of-the-art off-axis electron holography has been performed using the averaging of large series of holograms to improve the sensitivity of the measurements. These results are then compared to those obtained from pixelated differential phase contrast, a technique that belongs to pixelated (or 4D) scanning transmission electron microscopy (STEM) experiments. This emerging technique uses a pixelated detector to image the local diffraction patterns as the beam is scanned over the sample. For each diffraction pattern, the deflection of the beam is measured and converted into magnetic induction, while scanning the beam allows a map to be generated. Aberration corrected Lorentz (field-free) configurations of the TEM and STEM were used for an improved spatial resolution. We show that the pixelated STEM approach, even when performed using an old generation of charge-coupled device camera, provides better sensitivity at the expense of spatial resolution. A more general comparison of the two quantitative techniques is given.

Keywords

electron holography; pixelated DPC; 4D-STEM; pixelated STEM; magnetic induction; electric field; Lorentz microscopy; magnetic nanowire

Released

25.02.2021

Publisher

IOP PUBLISHING LTD

ISBN

1361-6463

Periodical

Journal of Physics D - Applied Physics

Year of study

54

Number

8

State

GB

Pages from

1

Pages to

11

Pages count

11

URL

https://iopscience.iop.org/article/10.1088/1361-6463/abc77d

Documents

2008.09308.pdf

BibTex 


@article{BUT167401,
  author="Victor {Boureau} and Michal {Staňo}",
  title="High-sensitivity mapping of magnetic induction fields with nanometer-scale resolution: comparison of off-axis electron holography and pixelated differential phase contrast",
  annote="We compare two transmission electron microscopy (TEM) based techniques that can provide highly spatially resolved quantitative measurements of magnetic induction fields at high sensitivity. To this end, the magnetic induction of a ferromagnetic NiFe nanowire has been measured and compared to micromagnetic modeling. State-of-the-art off-axis electron holography has been performed using the averaging of large series of holograms to improve the sensitivity of the measurements. These results are then compared to those obtained from pixelated differential phase contrast, a technique that belongs to pixelated (or 4D) scanning transmission electron microscopy (STEM) experiments. This emerging technique uses a pixelated detector to image the local diffraction patterns as the beam is scanned over the sample. For each diffraction pattern, the deflection of the beam is measured and converted into magnetic induction, while scanning the beam allows a map to be generated. Aberration corrected Lorentz (field-free) configurations of the TEM and STEM were used for an improved spatial resolution. We show that the pixelated STEM approach, even when performed using an old generation of charge-coupled device camera, provides better sensitivity at the expense of spatial resolution. A more general comparison of the two quantitative techniques is given.",
  address="IOP PUBLISHING LTD",
  chapter="167401",
  doi="10.1088/1361-6463/abc77d",
  howpublished="online",
  institution="IOP PUBLISHING LTD",
  number="8",
  volume="54",
  year="2021",
  month="february",
  pages="1--11",
  publisher="IOP PUBLISHING LTD",
  type="journal article in Web of Science"
}