Publication detail

DIFFRACTION PATTERN ANALYSIS FOR ACCURATE 2D NON-CONTACT DIMENSIONAL MEASUREMENTS

Nagy, Z., Kohoutek, M.

Original Title

DIFFRACTION PATTERN ANALYSIS FOR ACCURATE 2D NON-CONTACT DIMENSIONAL MEASUREMENTS

Type

conference paper

Language

English

Original Abstract

The paper deals with diffraction pattern analysis for accurate 2d non-contact dimensional measurements.

Key words in English

diffraction of light, subpixel analysis, dimensional measurement

Authors

Nagy, Z., Kohoutek, M.

RIV year

2005

Released

1. 1. 2005

Publisher

VIIP 2005

Location

Benidorm

Pages from

1

Pages to

6

Pages count

6

BibTex

@inproceedings{BUT16656,
  author="Zoltán {Nagy} and Michal {Kohoutek}",
  title="DIFFRACTION PATTERN ANALYSIS FOR ACCURATE 2D NON-CONTACT DIMENSIONAL MEASUREMENTS",
  booktitle="Proceedins of the Int. Conf. Visualisation, Imaging and Image Processing 2005",
  year="2005",
  series="edice",
  volume="rocnik",
  number="poradi",
  pages="6",
  publisher="VIIP 2005",
  address="Benidorm"
}