Publication detail

Structural analysis of GaAs-based PV cells after ionizing irradiation

PAPEŽ, N.

Original Title

Structural analysis of GaAs-based PV cells after ionizing irradiation

Type

conference paper

Language

English

Original Abstract

Morphology and structural analysis of photovoltaic cells based on GaAs before and after high dose gamma radiation of 500 kGy was investigated. Cobalt-60 emitter was used as the synthetic radioactive isotope. This radioactive form of cobalt is commonly used for space instruments and devices testing. Atomic force microscopy (AFM) was used to study the morphology and roughness differences. Cross-sectional investigation using transmission detector to thin layers observing was performed. Also, with use of sputtering system of Secondary Ion Mass Spectroscopy (SIMS) a detailed molecular and elemental information about the surface top layers was showed. Another molecular and structural changes in the top layers using two optical methods of Raman spectroscopy and spectrophotometry were also identified.

Keywords

GaAs, gamma radiation, AFM, STEM, SIMS, spectrophotometry

Authors

PAPEŽ, N.

Released

23. 4. 2020

Location

Brno

ISBN

978-80-214-5868-0

Book

Proceedings II of the 26 th Conference STUDENT EEICT 2020

Edition number

1

Pages from

203

Pages to

208

Pages count

6

URL

https://www.fekt.vut.cz/conf/EEICT/archiv/sborniky/EEICT_2020_sbornik_2.pdf

BibTex

@inproceedings{BUT165998,
  author="Nikola {Papež}",
  title="Structural analysis of GaAs-based PV cells after ionizing irradiation",
  booktitle="Proceedings II of the 26 th Conference STUDENT EEICT 2020",
  year="2020",
  number="1",
  pages="203--208",
  address="Brno",
  isbn="978-80-214-5868-0",
  url="https://www.fekt.vut.cz/conf/EEICT/archiv/sborniky/EEICT_2020_sbornik_2.pdf"
}