Publication detail

Noise and non-linearity in passive components as reliability indicators

PAVELKA, J., TACANO, M., ŠIKULA, J.

Original Title

Noise and non-linearity in passive components as reliability indicators

Type

conference paper

Language

English

Original Abstract

The noise spectroscopy and non-linearity measurement of thick film resistors and tantalum and niobium capacitors is proposed as a non-destructive testing tool for quality and reliability prediction. The correlation between long-term stability and current noise and third harmonic index of thick film resistors prepared using two different technologies was investigated. The charge carrier transport and noise analysis of Ta2O5 and Nb2O5 dielectric layer capacitors was performed to find correlation between leakage current and noise based quality indicators and optimize aging procedure

Key words in English

1/f noise, tantalum capacitor, Ta2O5, thick film resistor, reliability

Authors

PAVELKA, J., TACANO, M., ŠIKULA, J.

Released

1. 1. 2002

Publisher

Tohoku University

Location

Sendai, Japonsko

Pages from

5

Pages to

6

Pages count

2

BibTex

@inproceedings{BUT16520,
  author="Jan {Pavelka} and Munecazu {Tacano} and Josef {Šikula}",
  title="Noise and non-linearity in passive components as reliability indicators",
  booktitle="Proceedings of 17th ASATEF",
  year="2002",
  pages="2",
  publisher="Tohoku University",
  address="Sendai, Japonsko"
}