Publication detail

A Validation Tool for the Vdip Method for Earth Faults Localization and Its Evaluation

KRČÁL, V.

Original Title

A Validation Tool for the Vdip Method for Earth Faults Localization and Its Evaluation

English Title

A Validation Tool for the Vdip Method for Earth Faults Localization and Its Evaluation

Language

en

Original Abstract

This paper describes a process of evaluation of the Vdip method for earth faults localization. For purposes of method validation, PSCAD simulation are used. In PSCAD, fault occurrences are simulated and COMTRADE format records are created. The fault records are then pro-cessed in Matlab with evaluation of the fault location. This process and can be useful for test-ing before the real-world application and can serve as reference.

English abstract

This paper describes a process of evaluation of the Vdip method for earth faults localization. For purposes of method validation, PSCAD simulation are used. In PSCAD, fault occurrences are simulated and COMTRADE format records are created. The fault records are then pro-cessed in Matlab with evaluation of the fault location. This process and can be useful for test-ing before the real-world application and can serve as reference.

Keywords

Vdip; fault localization; PSCAD

Released

23.04.2020

Publisher

Vysoké učení technické v Brně, Fakulta elektrotechniky a komunikačních technologií

Location

Brno

ISBN

978-80-214-5867-3

Book

Proceedings I of the 26th Conference STUDENT EEICT 2020

Pages from

430

Pages to

434

Pages count

5

URL

Documents

BibTex


@inproceedings{BUT164329,
  author="Vít {Krčál}",
  title="A Validation Tool for the Vdip Method for Earth Faults Localization and Its Evaluation",
  annote="This paper describes a process of evaluation of the Vdip method for earth faults localization. For purposes of method validation, PSCAD simulation are used. In PSCAD, fault occurrences are simulated and COMTRADE format records are created. The fault records are then pro-cessed in Matlab with evaluation of the fault location. This process and can be useful for test-ing before the real-world application and can serve as reference.",
  address="Vysoké učení technické v Brně, Fakulta elektrotechniky a komunikačních technologií",
  booktitle="Proceedings I of the 26th Conference STUDENT EEICT 2020",
  chapter="164329",
  howpublished="online",
  institution="Vysoké učení technické v Brně, Fakulta elektrotechniky a komunikačních technologií",
  year="2020",
  month="april",
  pages="430--434",
  publisher="Vysoké učení technické v Brně, Fakulta elektrotechniky a komunikačních technologií"
}