Publication detail

Statistical Model Checking of Approximate Circuits: Challenges and Opportunities

STRNADEL, J.

Original Title

Statistical Model Checking of Approximate Circuits: Challenges and Opportunities

Type

conference paper

Language

English

Original Abstract

Many works have shown that approximate circuits may play an important role in the development of resource-efficient electronic systems. This motivates many researchers to propose new approaches for finding an optimal trade-off between the approximation error and resource savings for predefined applications of approximate circuits. The works and approaches, however, focus mainly on design aspects regarding relaxed functional requirements while neglecting further aspects such as signal and parameter dynamics/stochasticity, relaxed/non-functional equivalence, testing or formal verification. This paper aims to take a step ahead by moving towards the formal verification of time-dependent properties of systems based on approximate circuits. Firstly, it presents our approach to modeling such systems by means of stochastic timed automata whereas our approach goes beyond digital, combinational and/or synchronous circuits and is applicable in the area of sequential, analog and/or asynchronous circuits as well. Secondly, the paper shows the principle and advantage of verifying properties of modeled approximate systems by the statistical model checking technique. Finally, the paper evaluates our approach and outlines future research perspectives.

Keywords

approximate circuit, error, trade-off, relaxed equivalence, formal verification, timed automaton, stochastic automaton, modeling, simulation, statistical model checking

Authors

STRNADEL, J.

Released

1. 3. 2020

Publisher

IEEE Computer Society

Location

Grenoble

ISBN

978-3-9819263-4-7

Book

Proceedings of the 2020 Design, Automation & Test in Europe Conference & Exhibition (DATE)

Pages from

1574

Pages to

1577

Pages count

4

URL

https://ieeexplore.ieee.org/document/9116207

BibTex

@inproceedings{BUT162083,
  author="Josef {Strnadel}",
  title="Statistical Model Checking of Approximate Circuits: Challenges and Opportunities",
  booktitle="Proceedings of the 2020 Design, Automation & Test in Europe Conference & Exhibition (DATE)",
  year="2020",
  pages="1574--1577",
  publisher="IEEE Computer Society",
  address="Grenoble",
  doi="10.23919/DATE48585.2020.9116207",
  isbn="978-3-9819263-4-7",
  url="https://ieeexplore.ieee.org/document/9116207"
}