Publication detail

Contactless millimeter wave method for quality assessment of large area graphene

Bloos, D. Kunc, J. Kaeswurm, L. Myers-Ward, RL. Daniels, K. DeJarld, M. Nath, A. van Slageren, J. Gaskill, DK. Neugebauer, P.

Original Title

Contactless millimeter wave method for quality assessment of large area graphene

Type

journal article in Web of Science

Language

English

Original Abstract

We demonstrate that microwave absorption experiments offer a route for efficient measurements of transport properties for fast and accurate quality control of graphene. This conctactless characterization method can be used to quickly evaluate transport properties over large areas without recourse to complex lithographic methods making it suitable as a probe of quality during wafer scale fabrication. In particular, we demonstrate that absorption measurement of transport properties is sensitive to inhomogeneities in sample transport properties. This is in contrast to traditional methods using electrical contacts which tend to overestimate transport properties due to the formation of preferential conducting channels between the electrodes. Here we compare Shubnikov-de Haas oscillations simultaneously detected by microwave absorption and by conventional contact Hall bar measurements in fields up to 15 Ton quasi-free standing, large area (approximate to 25 mm(2)) monolayer graphene. We find that although the evaluated charge carrier densities from both measurements are similar, the mobility differs considerably due to electronic transport inhomogeneity.

Keywords

large area graphene; contactless measurements; Shubnikov de Haas oscillation; magneto-optical studies

Authors

Bloos, D.; Kunc, J. ; Kaeswurm, L.; Myers-Ward, RL. ; Daniels, K.; DeJarld, M.; Nath, A.; van Slageren, J.; Gaskill, DK.; Neugebauer, P.

Released

1. 7. 2019

ISBN

2053-1583

Periodical

2D Materials

Year of study

6

Number

3

State

United Kingdom of Great Britain and Northern Ireland

Pages from

035028

Pages to

035028

Pages count

8

URL

https://iopscience.iop.org/article/10.1088/2053-1583/ab1d7e

BibTex

@article{BUT159705,
  author="Bloos, D. and Kunc, J. and Kaeswurm, L. and Myers-Ward, RL. and Daniels, K. and DeJarld, M. and Nath, A. and van Slageren, J. and Gaskill, DK. and Neugebauer, P.",
  title="Contactless millimeter wave method for quality assessment of large area graphene",
  journal="2D Materials",
  year="2019",
  volume="6",
  number="3",
  pages="035028--035028",
  doi="10.1088/2053-1583/ab1d7e",
  issn="2053-1583",
  url="https://iopscience.iop.org/article/10.1088/2053-1583/ab1d7e"
}