Publication detail

On-chip nonlinear capacitor characterization

Sutorý, T., Kolka, Z.

Original Title

On-chip nonlinear capacitor characterization

Type

conference paper

Language

English

Original Abstract

The paper deals with characterization and linearization of non-linear capacitors of MOS transistors. Basic principles of compensation are presented. A test chip for nonlinear capacitance characterization implementing a new measurement method has been developed.

Key words in English

characterization, linearization, non-linear capacitors, MOS transistors, compensation, measurement

Authors

Sutorý, T., Kolka, Z.

RIV year

2005

Released

1. 1. 2005

ISBN

1581-4572

Periodical

Proceedings of the 15th International Electrotechnical and Computer Science Conference ERK 2006

State

Republic of Slovenia

Pages from

107

Pages to

110

Pages count

4

BibTex

@inproceedings{BUT15597,
  author="Tomáš {Sutorý} and Zdeněk {Kolka}",
  title="On-chip nonlinear capacitor characterization",
  booktitle="Proceedings of the fourteenth International Electrotechnical and Computer Science Conference ERK 2005",
  year="2005",
  journal="Proceedings of the 15th International Electrotechnical and Computer Science Conference ERK 2006",
  pages="4",
  issn="1581-4572"
}