Publication detail

Noise utilization in ADC linearity testing

Ondřej Sajdl, Radimír Vrba

Original Title

Noise utilization in ADC linearity testing

English Title

Noise utilization in ADC linearity testing

Type

conference paper

Language

en

Original Abstract

This paper presents the linearity characterization of an analog-to-digital converter (ADC). The input signal is noise, which allows low analog area overhead for built-in self-test (BIST). The linearity error estimation is proposed based on the spectral analysis of only the output of the converter. This paper presents the underlying theory and simulations supporting the effectiveness of the proposed method.

English abstract

This paper presents the linearity characterization of an analog-to-digital converter (ADC). The input signal is noise, which allows low analog area overhead for built-in self-test (BIST). The linearity error estimation is proposed based on the spectral analysis of only the output of the converter. This paper presents the underlying theory and simulations supporting the effectiveness of the proposed method.

Keywords

ADC, testing, linearity, noise

RIV year

2005

Released

24.10.2005

Publisher

Vysoké učení technické v Brně

Location

Brno

ISBN

80-214-3089-3

Book

Moderní metody řešení, návrhu a aplikace elektronických obvodů

Edition number

1

Pages from

76

Pages to

79

Pages count

4

BibTex


@inproceedings{BUT15550,
  author="Ondřej {Sajdl} and Radimír {Vrba}",
  title="Noise utilization in ADC linearity testing",
  annote="This paper presents the linearity characterization of an analog-to-digital converter
(ADC). The input signal is noise, which allows low analog area overhead for built-in
self-test (BIST). The linearity error estimation is proposed based on the spectral
analysis of only the output of the converter. This paper presents the underlying
theory and simulations supporting the effectiveness of the proposed method.",
  address="Vysoké učení technické v Brně",
  booktitle="Moderní metody řešení, návrhu a aplikace elektronických obvodů",
  chapter="15550",
  institution="Vysoké učení technické v Brně",
  year="2005",
  month="october",
  pages="76",
  publisher="Vysoké učení technické v Brně",
  type="conference paper"
}