Publication detail

Electric Field Strength in Layered Materials with Varied Parameters

KADLEC, R. KŘÍŽ, T.

Original Title

Electric Field Strength in Layered Materials with Varied Parameters

Type

conference paper

Language

English

Original Abstract

The authors report on an analysis of conditions on the boundary between layers having varied electromagnetic properties. Wave propagation in a layered material structure is discussed, utilizing analytical formulas for electric field strengths based on Snell's law and employing the Ray-tracing method for calculations associated with the propagation of the electromagnetic field. The analysis-related tasks are solved in the Matlab program. In our previous publications, this approach was compared with the analysis that exploits the FEM applied to the wave equation. The analytical solution includes the time-dependent propagation of electromagnetic waves in a heterogeneous medium and evaluates the distribution of the electromagnetic field on the surfaces of the boundaries at certain moments of time. The main designed algorithm facilitates simple evaluation of all components of the electromagnetic field in relation to the speed of the wave propagation in a heterogeneous medium. Silicon was chosen as a sample material. The material parameters are used with respect to their dependence on the wavelength of the electromagnetic wave; these parameters are obtained from the Refractive index database.

Keywords

Snell's law; Ray-tracing; electromagnetic waves; heterogeneous medium

Authors

KADLEC, R.; KŘÍŽ, T.

Released

1. 8. 2018

Publisher

IEEE

Location

Toyama, Japan

ISBN

978-4-88552-316-8

Book

Progress in Electromagnetics Research Symposium (PIERS-Toyama)

ISBN

1559-9450

Periodical

Progress In Electromagnetics

State

United States of America

Pages from

347

Pages to

351

Pages count

5

URL

BibTex

@inproceedings{BUT153288,
  author="Radim {Kadlec} and Tomáš {Kříž}",
  title="Electric Field Strength in Layered Materials with Varied Parameters",
  booktitle="Progress in Electromagnetics Research Symposium (PIERS-Toyama)",
  year="2018",
  journal="Progress In Electromagnetics",
  pages="347--351",
  publisher="IEEE",
  address="Toyama, Japan",
  doi="10.23919/PIERS.2018.8597924",
  isbn="978-4-88552-316-8",
  issn="1559-9450",
  url="https://ieeexplore.ieee.org/document/8597924"
}