Publication detail

A New Laboratory Workplace for Testing of ADCs

HÁZE, J. VRBA, R. BAJER, A.

Original Title

A New Laboratory Workplace for Testing of ADCs

English Title

A New Laboratory Workplace for Testing of ADCs

Type

conference paper

Language

en

Original Abstract

The paper describes a new laboratory workplace, which is used to measure basic properties of various ADCs. It contains of personal computer with measuring card, testing devices and samples. The testing process is controlled via software, which was also programmed. The workplace will be utilized in education of several subjects coupled to design of integrated circuits mostly ADCs.

English abstract

The paper describes a new laboratory workplace, which is used to measure basic properties of various ADCs. It contains of personal computer with measuring card, testing devices and samples. The testing process is controlled via software, which was also programmed. The workplace will be utilized in education of several subjects coupled to design of integrated circuits mostly ADCs.

Keywords

Education, testing of ADCs

RIV year

2005

Released

01.01.2005

Publisher

IMAPS CS

Location

Brno

ISBN

80-214-2990-9

Book

Proceedings of Electronic Devices and Systems IMAPS CS International Conference 2005

Pages from

411

Pages to

413

Pages count

3

BibTex


@inproceedings{BUT15264,
  author="Jiří {Háze} and Radimír {Vrba} and Arnošt {Bajer}",
  title="A New Laboratory Workplace for Testing of ADCs",
  annote="The paper describes a new laboratory workplace, which is used to measure basic properties of various ADCs. It contains of personal computer with measuring card, testing devices and samples. The testing process is controlled via software, which was also programmed. The workplace will be utilized in education of several subjects coupled to design of integrated circuits mostly ADCs.",
  address="IMAPS CS",
  booktitle="Proceedings of Electronic Devices and Systems IMAPS CS International Conference 2005",
  chapter="15264",
  institution="IMAPS CS",
  year="2005",
  month="january",
  pages="411",
  publisher="IMAPS CS",
  type="conference paper"
}